Search:
Computing and Library Services - delivering an inspiring information environment

Items where Author is Muhamedsalih, Hussam

Up a level
Export as [feed] RSS
Jump to: 2013 | 2012 | 2011 | 2010 | 2009
Number of items: 16.

2013

Blunt, Liam, Elrawemi, Mohamed, Fleming, Leigh, Martin, Haydn, Muhamedsalih, Hussam and Robbins, David (2013) Metrology for in process metrology for roll to roll production of flexible photovoltaics. In: Metrology Technologies to Enable Reel to Reel Processing of Emerging Products, November 20, 2013, National Physical Laboratory , Teddington, Middlesex, UK.. (Unpublished)

Blunt, Liam, Elrawemi, Mohamed, Fleming, Leigh, Martin, Haydn, Muhamedsalih, Hussam and Robbins, David (2013) Development of the basis for in process metrology for roll to roll production of flexible photovoltaics. In: 11th International Symposium on Measurement and Quality Control 2013, September 11-13, Cracow-Kielce, Poland.

Blunt, Liam, Fleming, Leigh, Elrawemi, Mohamed, Robbins, David and Muhamedsalih, Hussam (2013) In-line metrology of functional surfaces with a focus on defect assessment on large area Roll to Roll substrates. In: Proceedings of the 13th international conference of the european society for precision engineering and nanotechnology. EUSPEN, Germany, Berlin , pp. 71-74. ISBN 13:978-0-9566790-2-4

Muhamedsalih, Hussam (2013) Investigation of Wavelength Scanning Interferometry for Embedded Metrology. Doctoral thesis, University of Huddersfield.

2012

Muhamedsalih, Hussam, Gao, F. and Jiang, Xiang (2012) Comparison study of algorithms and accuracy in the wavelength scanning interferometry. Applied Optics, 51 (36). pp. 8854-8862. ISSN 0003-6935

Gao, F., Muhamedsalih, Hussam and Jiang, Xiang (2012) In-Process Fast Surface Measurement Using Wavelength Scanning Interferometry. Advanced Materials Research, 622-62. pp. 357-360. ISSN 1662-8985

Gao, F., Muhamedsalih, Hussam and Jiang, Xiang (2012) In-process fast surface measurement using wavelength scanning interferometry. In: 2012 International Conference on Manufacturing and Optimization , September 15-16, 2012, Beijing, China.

Gao, F., Muhamedsalih, Hussam and Jiang, Xiangqian (2012) Surface and thickness measurement of a transparent film using wavelength scanning interferometry. Optics Express, 20 (19). p. 21450. ISSN 1094-4087

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2012) Accelerated surface measurement using wavelength scanning interferometer with compensation of environmental noise. Procedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing. ISSN 1877-7058 (In Press)

2011

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2011) Comparison of fast Fourier transform and convolution in wavelength scanning interferometry. In: Proceedings of SPIE Volume 8082. SPIE Optical Metrology, 80820Q-80820Q.

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2011) Acceleration computing process in wavelength scanning interferometry. In: 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2011) , 29th June - 2nd July 2011, Daejeon, S. Korea. (Unpublished)

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2011) Wavelength scanning interferometry for measuring transparent films of the fusion targets. In: 13th International Conference on Metrology and Properties of Engineering Surfaces 2011, 12th - 15th April 2011, Twickenham, UK.

2010

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2010) Vibration compensation of wavelength scanning interferometer for in-process surface inspection. In: Future Technologies in Computing and Engineering: Proceedings of Computing and Engineering Annual Researchers' Conference 2010: CEARC’10. University of Huddersfield, Huddersfield, pp. 148-153. ISBN 9781862180932

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2010) Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford. (Unpublished)

Jiang, Xiang, Wang, Kaiwei, Gao, F. and Muhamedsalih, Hussam (2010) Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise. Applied Optics, 49 (15). pp. 2903-2909. ISSN 1559-128X

2009

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2009) Interferograms analysis for wavelength scanning interferometer using convolution and fourier transform. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2009: CEARC’09. University of Huddersfield, Huddersfield, pp. 33-37. ISBN 9781862180857

This list was generated on Fri Apr 25 06:35:32 2014 IST.

University of Huddersfield, Queensgate, Huddersfield, HD1 3DH Copyright and Disclaimer All rights reserved ©