Items where Author is Muhamedsalih, Hussam

Woodcock, Rebecca, Muhamedsalih, Hussam, Martin, Haydn and Jiang, Xiangqian (2016) Burg algorithm for enhancing measurement performance in wavelength scanning interferometry. Surface Topography: Metrology and Properties, 4 (2). 024003. ISSN 2051-672X

Gao, F., Muhamedsalih, Hussam, Tang, Dawei, Elrawemi, Mohamed, Blunt, Liam, Jiang, Xiang, Edge, Steven, Bird, David and Hollis, Philip (2015) In-situ defect detection systems for R2R flexible PV films. In: ASPE 2015 Summer Topical Meeting. American Society for Precision Engineering, Colarado, USA, pp. 44-49. ISBN 978-1-887706-68-1

Moschetti, Giuseppe, Muhamedsalih, Hussam, Jiang, Xiang, Leach, Richard K. and O'Connor, Daniel (2015) Extending the vertical range of wavelength scanning interferometry. In: Proceedings of the 5th ASPE Topical Meeting on Precision Interferometric Metrology. American Society for Precision Engineering, pp. 50-55. ISBN 978-1-887706-68-1

Blunt, Liam, Muhamedsalih, Hussam and Elrawemi, Mohamed (2015) Implementation of wavelength scanning interferometry for R2R flexible PV barrier films. In: EUSPEN 15th International Conference & Exhibition. EUSPEN, Leuven, Belgium. ISBN 978-0-9566790-7-9

Gao, Feng, Muhamedsalih, Hussam, Tang, Dawei, Elrawemi, Mohamed, Blunt, Liam, Jiang, Xiang, Edge, Steven, Bird, David and Hollis, Philip (2015) In-situ defect detection systems for R2R flexible PV barrier films. In: International Conference on Optical Instrument and Technology (OIT’2015), 17th-19th May, Beijing, China.

Elrawemi, Mohamed, Blunt, Liam, Muhamedsalih, Hussam, Gao, F. and Fleming, Leigh (2015) Implementation of in Process Surface Metrology for R2R Flexible PV Barrier Films. International Journal of Automation Technology, 9 (3). pp. 312-321. ISSN 1883-8022

Moschetti, Giuseppe, Muhamedsalih, Hussam, Connor, Daniel, Jiang, Xiang and Leach, Richard K. (2015) Vertical axis non-linearities in wavelength scanning interferometry. In: Laser Metrology and Machine Performance XI, LAMDAMAP 2015. EUSPEN, Huddersfield, UK, pp. 31-39. ISBN 978-0-9566790-5-5

Muhamedsalih, Hussam, Elrawemi, Mohamed, Blunt, Liam, Xiangqi, Lan and Martin, Haydn (2015) A computerised data handling procedure for defect detection and analysis for large area substrates manufactured by roll-to-roll process. In: Laser Metrology and Machine Performance XI, LAMDAMAP 2015. EUSPEN, Huddersfield, UK, pp. 84-91. ISBN 978-0-9566790-5-5

Muhamedsalih, Hussam, Blunt, Liam, Martin, Haydn, Hamersma, Ivo, Elrawemi, Mohamed and Feng, Gao (2015) An integrated opto-mechanical measurement system for in-process defect measurement on a roll-to-roll process. In: Laser Metrology and Machine Performance XI, LAMDAMAP 2015. EUSPEN, Huddersfield, UK, pp. 99-107. ISBN 978-0-9566790-5-5

Gao, Feng, Muhamedsalih, Hussam, Elrawemi, Mohamed, Blunt, Liam, Jiang, Xiang, Edge, Steven, Bird, David and Hollis, Philip (2014) A flexible PV barrier films defects detection system for in-situ R2R film processing. In: Special Interest Group Meeting: Structured Freeform Surfaces 2014 Programme, 19-20 Nov 2014, Padova, Italy.

Elrawemi, Mohamed, Blunt, Liam, Fleming, Leigh and Muhamedsalih, Hussam (2014) Wavelength Scanning Interferometery for large area roll to roll metrology applications in photovoltaic manufacturing environment. In: 10th LVMC Large Volume Metrology Conference and Exhibition, 18th -20th November 2014, The Mercure Manchester Piccadilly, UK.

Elrawemi, Mohamed, Blunt, Liam, Fleming, Leigh, Muhamedsalih, Hussam and Gao, F. (2014) Wavelength Scanning Interferometry for PV Production In-line Metrology. In: 3rd Annual EPSRC Manufacturing the Future Conference, 23rd – 24th September 2014, Glasgow Science Centre, Glasgow, UK.

Elrawemi, Mohamed, Blunt, Liam, Muhamedsalih, Hussam, Fleming, Leigh and Gao, Feng (2014) Verification of an in Process Optical System based on High Resolution Interferometry for Detecting Flexible PV Barrier Films Defects. In: Photon14, 1-4 September 2014, Imperial College, London, UK.

Blunt, Liam, Elrawemi, Mohamed, Fleming, Leigh, Robbins, David and Muhamedsalih, Hussam (2014) In-line metrology for defect assessment on large area Roll 2 Roll substrates. In: 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry (LMPMI 2014). Curran Associates, pp. 1-6. ISBN 9781632667311

Elrawemi, Mohamed, Muhamedsalih, Hussam, Blunt, Liam, Fleming, Leigh, Martin, Haydn and Jiang, Xiang (2014) Comparative study between online and offline defect assessment methods for roll to roll flexible PV modules. In: 4th International Conference on Nanomanufacturing (nanoMan2014), 8-10 July, Bremen, Germany.

Muhamedsalih, Hussam, Blunt, Liam, Martin, Haydn, Jiang, Xiang and Elrawemi, Mohamed (2014) An interferometric auto-focusing method for on-line defect assessment on a roll-to-roll process using wavelength scanning interferometry. In: Proceedings of EUSPEN 14th International Conference 2014. EUSPEN, Dubrovnik, Croatia, pp. 177-180. ISBN 978-0-9566790-3-1

Blunt, Liam, Elrawemi, Mohamed, Fleming, Leigh, Martin, Haydn, Muhamedsalih, Hussam and Robbins, David (2013) Metrology for in process metrology for roll to roll production of flexible photovoltaics. In: Metrology Technologies to Enable Reel to Reel Processing of Emerging Products, November 20, 2013, National Physical Laboratory , Teddington, Middlesex, UK.. (Unpublished)

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2013) Accelerated surface measurement using wavelength scanning interferometer with compensation of environmental noise. Procedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing, 10. pp. 70-76. ISSN 1877-7058

Blunt, Liam, Elrawemi, Mohamed, Fleming, Leigh, Martin, Haydn, Muhamedsalih, Hussam and Robbins, David (2013) Development of the basis for in process metrology for roll to roll production of flexible photovoltaics. In: Proceedings of the 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry. International Measurement Confederation (IMEKO), Gdansk, Poland, pp. 363-366. ISBN 978-1-63266-817-2

Muhamedsalih, Hussam, Jiang, Xiang and Gao, Feng (2013) Accelerated Surface Measurement Using Wavelength Scanning Interferometer with Compensation of Environmental Noise. Procedia CIRP, 10. pp. 70-76. ISSN 2212-8271

Blunt, Liam, Fleming, Leigh, Elrawemi, Mohamed, Robbins, David and Muhamedsalih, Hussam (2013) In-line metrology of functional surfaces with a focus on defect assessment on large area Roll to Roll substrates. In: Proceedings of the 13th international conference of the european society for precision engineering and nanotechnology. EUSPEN, Germany, Berlin, pp. 71-74. ISBN 13:978-0-9566790-2-4

Muhamedsalih, Hussam (2013) Investigation of Wavelength Scanning Interferometry for Embedded Metrology. Doctoral thesis, University of Huddersfield.

Muhamedsalih, Hussam, Gao, F. and Jiang, Xiang (2012) Comparison study of algorithms and accuracy in the wavelength scanning interferometry. Applied Optics, 51 (36). pp. 8854-8862. ISSN 0003-6935

Gao, F., Muhamedsalih, Hussam and Jiang, Xiang (2012) In-Process Fast Surface Measurement Using Wavelength Scanning Interferometry. Advanced Materials Research, 622-62. pp. 357-360. ISSN 1662-8985

Gao, F., Muhamedsalih, Hussam and Jiang, Xiang (2012) In-process fast surface measurement using wavelength scanning interferometry. In: 2012 International Conference on Manufacturing and Optimization, September 15-16, 2012, Beijing, China.

Gao, F., Muhamedsalih, Hussam and Jiang, Xiangqian (2012) Surface and thickness measurement of a transparent film using wavelength scanning interferometry. Optics Express, 20 (19). p. 21450. ISSN 1094-4087

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2011) Comparison of fast Fourier transform and convolution in wavelength scanning interferometry. In: Proceedings of SPIE Volume 8082. SPIE Optical Metrology, 80820Q-80820Q.

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2011) Acceleration computing process in wavelength scanning interferometry. In: 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2011), 29th June - 2nd July 2011, Daejeon, S. Korea. (Unpublished)

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2011) Wavelength scanning interferometry for measuring transparent films of the fusion targets. In: 13th International Conference on Metrology and Properties of Engineering Surfaces 2011, 12th - 15th April 2011, Twickenham, UK.

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2010) Vibration compensation of wavelength scanning interferometer for in-process surface inspection. In: Future Technologies in Computing and Engineering: Proceedings of Computing and Engineering Annual Researchers' Conference 2010: CEARC’10. University of Huddersfield, Huddersfield, pp. 148-153. ISBN 9781862180932

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2010) Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford. (Unpublished)

Jiang, Xiang, Wang, Kaiwei, Gao, F. and Muhamedsalih, Hussam (2010) Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise. Applied Optics, 49 (15). pp. 2903-2909. ISSN 1559-128X

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2009) Interferograms analysis for wavelength scanning interferometer using convolution and fourier transform. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2009: CEARC’09. University of Huddersfield, Huddersfield, pp. 33-37. ISBN 9781862180857

Muhamedsalih, Hussam, Jiang, Xiang and Wang, Kaiwei (2009) Surface Profile Height Measurement Using Optical Interferometry Method. In: University of Huddersfield Research Festival, 23rd March - 2nd April 2009, University of Huddersfield. (Unpublished)