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Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2010) Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford. (Unpublished)
Information
URI:
https://eprints.hud.ac.uk/id/eprint/9072
Title:
Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target
Creators:
Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn
Official URL:
http://www.clf.rl.ac.uk/18838.aspx
Date:
1 October 2010
Subjects:
T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology > TS Manufactures
Schools:
School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Library
Item Type:
Conference or Workshop Item
Presentation Type:
Speech
Depositing User:
Feng Gao
Date Deposited:
19 Nov 2010 15:34
Revision:
21
Last Modified:
28 Aug 2021 21:55
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