Wavelength Scanning Interferometery for large area roll to roll metrology applications in photovoltaic manufacturing environment

The wavelength scanning interferometer is currently being applied as a core metrology technology as part of the EU project NanoMend - Nanoscale Defect Detection, Cleaning and Repair for Large Area Substrates ̴500 mm width.
NanoMend Project aims to develop technologies that are able to detect and correct micro and nano-scale defects in roll-to-roll produced films in order to improve product performance, yield and lifetime.