Wavelength Scanning Interferometery for large area roll to roll metrology applications in photovoltaic manufacturing environment

Elrawemi, Mohamed; Blunt, Liam; Fleming, Leigh; Muhamedsalih, Hussam

Wavelength Scanning Interferometery for large area roll to roll metrology applications in photovoltaic manufacturing environment

Elrawemi, Mohamed, Blunt, Liam, Fleming, Leigh and Muhamedsalih, Hussam (2014) Wavelength Scanning Interferometery for large area roll to roll metrology applications in photovoltaic manufacturing environment. In: 10th LVMC Large Volume Metrology Conference and Exhibition, 18th -20th November 2014, The Mercure Manchester Piccadilly, UK.

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Abstract

The wavelength scanning interferometer is currently being applied as a core metrology technology as part of the EU project NanoMend - Nanoscale Defect Detection, Cleaning and Repair for Large Area Substrates ̴500 mm width.
NanoMend Project aims to develop technologies that are able to detect and correct micro and nano-scale defects in roll-to-roll produced films in order to improve product performance, yield and lifetime.

Information

URI:

https://eprints.hud.ac.uk/id/eprint/22447

Title:

Wavelength Scanning Interferometery for large area roll to roll metrology applications in photovoltaic manufacturing environment

Creators:

Elrawemi, Mohamed, Blunt, Liam, Fleming, Leigh and Muhamedsalih, Hussam

Official URL:

http://www.lvmc.eu/

Date:

18 November 2014

Subjects: