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Items where Author is Gao, Feng

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Number of items: 46.

Article

Muhamedsalih, Hussam, Jiang, Xiang and Gao, Feng (2013) Accelerated Surface Measurement Using Wavelength Scanning Interferometer with Compensation of Environmental Noise. Procedia CIRP, 10. pp. 70-76. ISSN 2212-8271

Zhang, Zonghua, Huang, Shujun, Meng, Shasha, Gao, Feng and Jiang, Xiangqian (2013) A simple, flexible and automatic 3D calibration method for a phase calculation-based fringe projection imaging system. Optics Express, 21 (10). p. 12218. ISSN 1094-4087

Liang, Bo, Iwnicki, Simon, Gao, Feng, Ball, Andrew, Tran, Van Tung and Cattley, Robert (2013) Railway Wheel Flat and Rail Surface Defect Detection by Time-frequency Analysis. Chemical Engineering Transactions, 33. pp. 745-750. ISSN 1974-9791

Muhamedsalih, Hussam, Gao, F. and Jiang, Xiang (2012) Comparison study of algorithms and accuracy in the wavelength scanning interferometry. Applied Optics, 51 (36). pp. 8854-8862. ISSN 0003-6935

Gao, F., Muhamedsalih, Hussam and Jiang, Xiang (2012) In-Process Fast Surface Measurement Using Wavelength Scanning Interferometry. Advanced Materials Research, 622-62. pp. 357-360. ISSN 1662-8985

Gao, F., Muhamedsalih, Hussam and Jiang, Xiangqian (2012) Surface and thickness measurement of a transparent film using wavelength scanning interferometry. Optics Express, 20 (19). p. 21450. ISSN 1094-4087

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2012) Accelerated surface measurement using wavelength scanning interferometer with compensation of environmental noise. Procedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing. ISSN 1877-7058 (In Press)

Feng, Gao, Wang, Xuanze and Jiang, Xiang (2012) A Digital Phase-Lock Method for AOD Scanning Measurement System. International Journal of Mechanic Systems Engineering, 2 (1). pp. 42-47. ISSN 2225-7403

Jiang, Xiang, Wang, Kaiwei, Gao, F. and Muhamedsalih, Hussam (2010) Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise. Applied Optics, 49 (15). pp. 2903-2909. ISSN 1559-128X

Gao, F., Leach, Richard K., Petzing, J and Coupland, J. M. (2008) Surface Measurement Errors using Commercial Scanning White Light Interferometers. Measurement Science and Technology, 19 (1). 015303. ISSN 0957-0233

Liu, X. and Gao, F. (2003) A novel multi-function tribological probe microscope for mapping surface properties. Measurement Science and Technology, 15 (1). pp. 91-102. ISSN 0957-0233

Gao, F., Peng, G. and Koenders, L. (1998) Calibration of transfer standards for SPM. Microelectronic Engineering , 41 (42). pp. 615-618. ISSN 0167-9317

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1993) A Fabry—Perot Interferometer for Measuring Micro-Displacement. ACTA Metrologica SINCA, 14 (2). pp. 94-98. ISSN 0894-0525

Gao, F. and Xu, Y. (1991) The Study of a Fold Cavity Fabry-Perot Interferometer and it’s Phase. Optoelectronic Engineering, 20 (3). pp. 18-20. ISSN 1003-501X

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) A High Precision Heterodyne Laser Interferometer for Measuring Micro-displacement. ACTA Metrologica SINICA, 11 (1). pp. 32-35.

Book Chapter

Ren, Hongyu, Jiang, Xiang and Gao, F. (2013) Simulation of Tri-sensor Deflectometry for Freeform and Structured Specular Surfaces. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2013 : CEARC'13. University of Huddersfield, Huddersfield, p. 236. ISBN 9781862181212

Tang, Dawei, Gao, F. and Jiang, Xiang (2013) Spectral Domain Low- Coherence Interferometry for On-line Surface Inspection. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2013 : CEARC'13. University of Huddersfield, Huddersfield, pp. 194-199. ISBN 9781862181212

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2011) Comparison of fast Fourier transform and convolution in wavelength scanning interferometry. In: Proceedings of SPIE Volume 8082. SPIE Optical Metrology, 80820Q-80820Q.

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2010) Vibration compensation of wavelength scanning interferometer for in-process surface inspection. In: Future Technologies in Computing and Engineering: Proceedings of Computing and Engineering Annual Researchers' Conference 2010: CEARC’10. University of Huddersfield, Huddersfield, pp. 148-153. ISBN 9781862180932

Jiang, Xiang, Gao, F. and Mateboer, A. (2010) An approach of assessment for ultra-precision V-groove structured surfaces. In: Proceedings of the euspen International Conference – Delft - June 2010. European Society for Precision Engineering & Nanotechnology, Delft, Netherlands.

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2009) Interferograms analysis for wavelength scanning interferometer using convolution and fourier transform. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2009: CEARC’09. University of Huddersfield, Huddersfield, pp. 33-37. ISBN 9781862180857

Gao, F., Wang, Kaiwei and Jiang, Xiang (2009) A high speed scanning heterodyne interferometer for in process surface measurement. In: Proceedings of the euspen International Conference – San Sebastian - June 2009. European Society for Precision Engineering & Nanotechnology, San Sebastian, Spain. ISBN 13:978-0-9553082-6-0

Gao, F., Petzing, J, Coupland, J. M. and Leach, Richard K. (2007) Measurement of structured surface using stylus, AFM and optical methods. In: Metrology and properties of engineering surfaces: proceedings of the 11th international conference, Huddersfield, on 17th-20th July 2007. University of Huddersfield, Huddersfield, UK, p. 363. ISBN 1862180571

Liu, X., Bell, T., Gao, F. and Chetwynd, D. G. (2002) Characterisation of engineered surfaces by a multi-function tribological probe microscope. In: EUSPEN International Conference 2002. EUSPEN, pp. 719-722.

Conference or Workshop Item

Elrawemi, Mohamed, Blunt, Liam, Muhamedsalih, Hussam, Fleming, Leigh and Gao, Feng (2014) Verification of an in Process Optical System based on High Resolution Interferometry for Detecting Flexible PV Barrier Films Defects. In: Photon14, 1-4 September 2014, Imperial College, London, UK. (In Press)

Dawei, Tang, Feng, Gao and Xiangqian, Jiang (2014) Cylindrical Lenses Based Spectral Domain Low-Coherence Interferometry for On-line Surface Inspection. In: Euspen 14th International Conference & Exhibition, 2nd - 6th June 2014, Dubrovnik, Croatia.

Gao, F., Tang, Dawei and Jiang, Xiang (2013) White Light Spetral Interferometry for Real Time Surface Profile Measurement. In: ASPEN 2013, 12-15, November 2013, Taipei, Taiwan. (Unpublished)

Gao, F., Muhamedsalih, Hussam and Jiang, Xiang (2012) In-process fast surface measurement using wavelength scanning interferometry. In: 2012 International Conference on Manufacturing and Optimization , September 15-16, 2012, Beijing, China.

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2011) Acceleration computing process in wavelength scanning interferometry. In: 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2011) , 29th June - 2nd July 2011, Daejeon, S. Korea. (Unpublished)

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2011) Wavelength scanning interferometry for measuring transparent films of the fusion targets. In: 13th International Conference on Metrology and Properties of Engineering Surfaces 2011, 12th - 15th April 2011, Twickenham, UK.

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2010) Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford. (Unpublished)

Jiang, Xiang, Gao, F. and Wang, Kaiwei (2010) Wavelength Scanning Interferometer for Structured Surfaces. In: ASPE Summer Topical Meeting on Precision Interferometric Metrology, 23rd - 25th June 2010, Asheville, North Carolina, USA.

Gao, F., Jiang, Xiang and Blunt, Liam (2009) Automated ballistic and tool mark identification. In: University of Huddersfield Research Festival, 23rd March - 2nd April 2009, University of Huddersfield. (Unpublished)

Lobera, L, Gao, F., Petzing, J and Coupland, J. M. (2008) Limitations and Innovations in Scanning White Light Interferometry. In: euspen 10th Anniversary International Conference, 18-22 May 2008 , Zurich, Switzerland,.

Gao, F., Coupland, J. M. and Petzing, J. (2006) V-groove measurement with white light interferometry. In: Photon06, 4-7 September, 2006, Manchester.

Liu, X. and Gao, F. (2001) Multi-function evaluation of surfaces at micro/nano scales by a new tribological probe microscope. In: 2nd euspen International Conference, 27-31, May 2001, Turin, Italy.

Gao, F. and Liu, X. (2000) A multi-functional tribological probe microscope for surface and surface related properties. In: The euspen nanotechnology workshop and Joint Warwick-Tokyo Nanotechnology Symposium, Sep. 2000, Warwick, UK.

Gao, F. and Liu, X (2000) Development of a new multi-function tribological Microscope. In: 1st euspen Topical Conference on Fabrication and Metrology in Nanotechnology and 2nd Annual General Meeting of euspen, 31 May - 2 June, 2000 , Copenhagen, Denmark.

Gao, F., Peng, G., Zhao, X. and Koenders, L. (1997) Calibration of Standards and Application by SPM. In: The 9th International Precision Engineering Seminar, May 1997, Braunschweig, Germany. (Unpublished)

Gao, F., Harms, C., Zhao, X. and Koenders, L. (1997) Calibration of Standard Using a Scanning Probe Microscope. In: European Workshop on Micro-technology and Scanning Probe Microscope, 1997, Mainz, Germany .

Gao, F. (1993) A Reflective Optic Fiber Displacement Sensor. In: Young Scientists Symposium of National Institute of Metrology, 1993, Beijing, China.

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) A High Precision Fold Fabry-Perot Interferometer for Measuring Displacement. In: National Geometric Metrology Symposium, 1990, Qingdao, China .

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) Precise Determination of 633nm He-Ne Laser Wavelength in Air. In: 12th IMEKO World Congress Measurement and Progress DIGESE, 1990, Beijing, China .

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) A Laser Heterodyne Interferometer for Measuring Air Refractive Index. In: National Geometric Metrology Symposium, 1990, Qingdao, China .

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1989) A Laser Heterodyne Interferometer for Measuring Nanometer Displacement. In: 2nd IMEKO TC14 International Symposium on Metrology for Quality Control in Production, 1989, Beijing, China.

Gao, F., Wang, B. and Zhuang, B. (1987) A Projection Photoelectric 2D Positioning System. In: National Symposium of Opto-Electronic technology, 1987, Jilin, China.

This list was generated on Sat Aug 30 17:17:20 2014 IST.

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