Items where Author is Gao, Feng

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Elrawemi, Mohamed, Blunt, Liam, Muhamedsalih, Hussam, Gao, F. and Fleming, Leigh (2015) Implementation of in Process Surface Metrology for R2R Flexible PV Barrier Films. International Journal of Automation Technology, 9 (3). pp. 312-321. ISSN 1883-8022

Elrawemi, Mohamed, Blunt, Liam, Fleming, Leigh, Muhamedsalih, Hussam and Gao, F. (2014) Wavelength Scanning Interferometry for PV Production In-line Metrology. In: 3rd Annual EPSRC Manufacturing the Future Conference, 23rd – 24th September 2014, Glasgow Science Centre, Glasgow, UK.

Elrawemi, Mohamed, Blunt, Liam, Muhamedsalih, Hussam, Fleming, Leigh and Gao, Feng (2014) Verification of an in Process Optical System based on High Resolution Interferometry for Detecting Flexible PV Barrier Films Defects. In: Photon14, 1-4 September 2014, Imperial College, London, UK.

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Feng, Gao, Hu, Niaoqing, Mones, Z., Gu, Fengshou and Ball, Andrew (2016) An investigation of the orthogonal outputs from an on-rotor MEMS accelerometer for reciprocating compressor condition monitoring. Mechanical Systems and Signal Processing, 76-77. pp. 228-241. ISSN 0888-3270

Feng, Gao, Wang, Xuanze and Jiang, Xiang (2012) A Digital Phase-Lock Method for AOD Scanning Measurement System. International Journal of Mechanic Systems Engineering, 2 (1). pp. 42-47. ISSN 2225-7403

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Gao, F. and Jiang, Xiang (2017) Environmental robust interferometry for online/in-process surface inspection. In: The 2nd International Forum on Surface and Microscopy, 7-9 August 2017, Harbin, China. (Unpublished)

Gao, Feng (2017) Interferometry for Online/In-Process Surface Inspection. In: Optical Interferometry. InTech, Rijeka, Croatia, pp. 41-60. ISBN 978-953-51-2955-4

Gao, Feng (2017) Interferometry for Online/In-Process Surface Inspection. In: Optical Interferometry. InTech. ISBN 978-953-51-2955-4

Gao, F., Xu, Yongjia, Ren, Hongyu, Zhang, Zonghua and Jiang, Xiang (2016) A novel camera calibration method for deflectometry system. In: 16th International Conference and Exhibition, 30th May-3rd June 2016, Nottingham, UK.

Gao, F., Muhamedsalih, Hussam, Tang, Dawei, Elrawemi, Mohamed, Blunt, Liam, Jiang, Xiang, Edge, Steven, Bird, David and Hollis, Philip (2015) In-situ defect detection systems for R2R flexible PV films. In: ASPE 2015 Summer Topical Meeting. American Society for Precision Engineering, Colarado, USA, pp. 44-49. ISBN 978-1-887706-68-1

Gao, Feng, Muhamedsalih, Hussam, Tang, Dawei, Elrawemi, Mohamed, Blunt, Liam, Jiang, Xiang, Edge, Steven, Bird, David and Hollis, Philip (2015) In-situ defect detection systems for R2R flexible PV barrier films. In: International Conference on Optical Instrument and Technology (OIT’2015), 17th-19th May, Beijing, China.

Gao, Feng, Muhamedsalih, Hussam, Elrawemi, Mohamed, Blunt, Liam, Jiang, Xiang, Edge, Steven, Bird, David and Hollis, Philip (2014) A flexible PV barrier films defects detection system for in-situ R2R film processing. In: Special Interest Group Meeting: Structured Freeform Surfaces 2014 Programme, 19-20 Nov 2014, Padova, Italy.

Gao, F., Tang, Dawei and Jiang, Xiang (2013) White Light Spectral Interferometry for Real Time Surface Profile Measurement. In: ASPEN 2013, 12-15, November 2013, Taipei, Taiwan. (Unpublished)

Gao, F., Muhamedsalih, Hussam and Jiang, Xiang (2012) In-Process Fast Surface Measurement Using Wavelength Scanning Interferometry. Advanced Materials Research, 622-62. pp. 357-360. ISSN 1662-8985

Gao, F., Muhamedsalih, Hussam and Jiang, Xiang (2012) In-process fast surface measurement using wavelength scanning interferometry. In: 2012 International Conference on Manufacturing and Optimization, September 15-16, 2012, Beijing, China.

Gao, F., Muhamedsalih, Hussam and Jiang, Xiangqian (2012) Surface and thickness measurement of a transparent film using wavelength scanning interferometry. Optics Express, 20 (19). p. 21450. ISSN 1094-4087

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2011) Wavelength scanning interferometry for measuring transparent films of the fusion targets. In: 13th International Conference on Metrology and Properties of Engineering Surfaces 2011, 12th - 15th April 2011, Twickenham, UK.

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2010) Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford. (Unpublished)

Gao, F., Wang, Kaiwei and Jiang, Xiang (2009) A high speed scanning heterodyne interferometer for in process surface measurement. In: Proceedings of the euspen International Conference – San Sebastian - June 2009. European Society for Precision Engineering & Nanotechnology, San Sebastian, Spain. ISBN 13:978-0-9553082-6-0

Gao, F., Jiang, Xiang and Blunt, Liam (2009) Automated ballistic and tool mark identification. In: University of Huddersfield Research Festival, 23rd March - 2nd April 2009, University of Huddersfield. (Unpublished)

Gao, F., Leach, Richard K., Petzing, J and Coupland, J. M. (2008) Surface Measurement Errors using Commercial Scanning White Light Interferometers. Measurement Science and Technology, 19 (1). 015303. ISSN 0957-0233

Gao, F., Petzing, J, Coupland, J. M. and Leach, Richard K. (2007) Measurement of structured surface using stylus, AFM and optical methods. In: Metrology and properties of engineering surfaces: proceedings of the 11th international conference, Huddersfield, on 17th-20th July 2007. University of Huddersfield, Huddersfield, UK, p. 363. ISBN 1862180571

Gao, F., Coupland, J. M. and Petzing, J. (2006) V-groove measurement with white light interferometry. In: Photon06, 4-7 September, 2006, Manchester.

Gao, F. and Liu, X. (2000) A multi-functional tribological probe microscope for surface and surface related properties. In: The euspen nanotechnology workshop and Joint Warwick-Tokyo Nanotechnology Symposium, Sep. 2000, Warwick, UK.

Gao, F. and Liu, X (2000) Development of a new multi-function tribological Microscope. In: 1st euspen Topical Conference on Fabrication and Metrology in Nanotechnology and 2nd Annual General Meeting of euspen, 31 May - 2 June, 2000, Copenhagen, Denmark.

Gao, F., Peng, G. and Koenders, L. (1998) Calibration of transfer standards for SPM. Microelectronic Engineering, 41 (42). pp. 615-618. ISSN 0167-9317

Gao, F., Peng, G., Zhao, X. and Koenders, L. (1997) Calibration of Standards and Application by SPM. In: The 9th International Precision Engineering Seminar, May 1997, Braunschweig, Germany. (Unpublished)

Gao, F., Harms, C., Zhao, X. and Koenders, L. (1997) Calibration of Standard Using a Scanning Probe Microscope. In: European Workshop on Micro-technology and Scanning Probe Microscope, 1997, Mainz, Germany.

Gao, F. (1993) A Reflective Optic Fiber Displacement Sensor. In: Young Scientists Symposium of National Institute of Metrology, 1993, Beijing, China.

Gao, F. and Xu, Y. (1991) The Study of a Fold Cavity Fabry-Perot Interferometer and it’s Phase. Optoelectronic Engineering, 20 (3). pp. 18-20. ISSN 1003-501X

Gao, F., Wang, B. and Zhuang, B. (1987) A Projection Photoelectric 2D Positioning System. In: National Symposium of Opto-Electronic technology, 1987, Jilin, China.

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Han, Feng, Yang, Shuming, Jing, Weixuan, Wang, Liangjun, Li, Lei, Jiang, Zhuangde and Gao, Feng (2015) Effect of Ag Thin Films on the Photoluminescence of ZnO Films. Journal of Nanoscience and Nanotechnology, 15 (5). pp. 3796-3801. ISSN 1533-4880

Huang, Shujun, Xie, Lili, Wang, Zhangying, Zhang, Zonghua, Gao, Feng and Jiang, Xiangqian (2015) Accurate projector calibration method by using an optical coaxial camera. Applied Optics, 54 (4). pp. 789-795. ISSN 0003-6935

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Jiang, Xiang, Tang, Dawei and Gao, Feng (2015) In-Situ Surface Inspection Using White Light Channelled Spectrum Interferometer. In: 15th International Conference on Metrology and Properties of Engineering Surfaces, 2-5 March 2015, Charlotte, North Carolina, USA. (Unpublished)

Jiang, Xiang, Gao, F. and Wang, Kaiwei (2010) Wavelength Scanning Interferometer for Structured Surfaces. In: ASPE Summer Topical Meeting on Precision Interferometric Metrology, 23rd - 25th June 2010, Asheville, North Carolina, USA.

Jiang, Xiang, Gao, F. and Mateboer, A. (2010) An approach of assessment for ultra-precision V-groove structured surfaces. In: Proceedings of the euspen International Conference – Delft - June 2010. European Society for Precision Engineering & Nanotechnology, Delft, Netherlands.

Jiang, Xiang, Wang, Kaiwei, Gao, F. and Muhamedsalih, Hussam (2010) Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise. Applied Optics, 49 (15). pp. 2903-2909. ISSN 1559-128X

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Liu, Yue, Huang, Shujun, Zhang, Zonghua, Gao, Nan, Gao, Feng and Jiang, Xiang (2017) Full-field 3D shape measurement of discontinuous specular objects by direct phase measuring deflectometry. Scientific Reports, 7 (10293). ISSN 2045-2322

Liu, Xiaohong, Huang, Shujun, Zhang, Zonghua, Gao, F. and Jiang, Xiang (2017) Full-field calibration of color camera chromatic aberration using absolute phase maps. Sensors, 17 (5). ISSN 1424-8220

Liu, X, Huang, Shujun, Zhang, Zonghua, Gao, Feng and Jiang, Xiang (2016) Full-field calibration and compensation of lateral chromatic aberration based on unwrapped phase. In: SPIE: Optical Metrology and Inspection for Industrial Applications IV, 12-14 October 2016, Beijing, China.

Liang, Bo, Iwnicki, Simon, Gao, Feng, Ball, Andrew, Tran, Van Tung and Cattley, Robert (2013) Railway Wheel Flat and Rail Surface Defect Detection by Time-frequency Analysis. Chemical Engineering Transactions, 33. pp. 745-750. ISSN 1974-9791

Lobera, L, Gao, F., Petzing, J and Coupland, J. M. (2008) Limitations and Innovations in Scanning White Light Interferometry. In: euspen 10th Anniversary International Conference, 18-22 May 2008, Zurich, Switzerland,.

Liu, X. and Gao, F. (2003) A novel multi-function tribological probe microscope for mapping surface properties. Measurement Science and Technology, 15 (1). pp. 91-102. ISSN 0957-0233

Liu, X., Bell, T., Gao, F. and Chetwynd, D. G. (2002) Characterisation of engineered surfaces by a multi-function tribological probe microscope. In: EUSPEN International Conference 2002. EUSPEN, pp. 719-722.

Liu, X. and Gao, F. (2001) Multi-function evaluation of surfaces at micro/nano scales by a new tribological probe microscope. In: 2nd euspen International Conference, 27-31, May 2001, Turin, Italy.

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Muhamedsalih, Hussam, Blunt, Liam, Martin, Haydn, Hamersma, Ivo, Elrawemi, Mohamed and Feng, Gao (2015) An integrated opto-mechanical measurement system for in-process defect measurement on a roll-to-roll process. In: Laser Metrology and Machine Performance XI, LAMDAMAP 2015. EUSPEN, Huddersfield, UK, pp. 99-107. ISBN 978-0-9566790-5-5

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2013) Accelerated surface measurement using wavelength scanning interferometer with compensation of environmental noise. Procedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing, 10. pp. 70-76. ISSN 1877-7058

Muhamedsalih, Hussam, Jiang, Xiang and Gao, Feng (2013) Accelerated Surface Measurement Using Wavelength Scanning Interferometer with Compensation of Environmental Noise. Procedia CIRP, 10. pp. 70-76. ISSN 2212-8271

Muhamedsalih, Hussam, Gao, F. and Jiang, Xiang (2012) Comparison study of algorithms and accuracy in the wavelength scanning interferometry. Applied Optics, 51 (36). pp. 8854-8862. ISSN 0003-6935

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2011) Comparison of fast Fourier transform and convolution in wavelength scanning interferometry. In: Proceedings of SPIE Volume 8082. SPIE Optical Metrology, 80820Q-80820Q.

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2011) Acceleration computing process in wavelength scanning interferometry. In: 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2011), 29th June - 2nd July 2011, Daejeon, S. Korea. (Unpublished)

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2010) Vibration compensation of wavelength scanning interferometer for in-process surface inspection. In: Future Technologies in Computing and Engineering: Proceedings of Computing and Engineering Annual Researchers' Conference 2010: CEARC’10. University of Huddersfield, Huddersfield, pp. 148-153. ISBN 9781862180932

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2009) Interferograms analysis for wavelength scanning interferometer using convolution and fourier transform. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2009: CEARC’09. University of Huddersfield, Huddersfield, pp. 33-37. ISBN 9781862180857

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Niu, Z, Gao, Nan, Zhang, Zonghua, Gao, Feng and Jiang, Xiang (2018) 3D shape measurement of discontinuous specular objects based on advanced PMD with bi-telecentric lens. Optics Express, 26 (2). pp. 1615-1632. ISSN 1094-4087

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Ren, Hongyu, Gao, Feng and Jiang, Xiangqian (2016) Least-squares method for data reconstruction from gradient data in deflectometry. Applied Optics, 55 (22). pp. 6052-6059. ISSN 0003-6935

Ren, Hongyu, Gao, Feng and Jiang, Xiang (2016) Simulation study of a refined approach for specular surfaces reconstruction in deflectometry. In: 16th International Conference and Exhibition EUSPEN, 30th May-3rd June 2016, Nottingham, UK.

Ren, Hongyu, Gao, Feng and Jiang, Xiangqian (2015) Improvement of high-order least-squares integration method for stereo deflectometry. Applied Optics, 54 (34). pp. 10249-10255. ISSN 0003-6935

Ren, Hongyu, Gao, Feng and Jiang, Xiangqian (2015) Iterative optimization calibration method for stereo deflectometry. Optics Express, 23 (17). pp. 22060-22068. ISSN 1094-4087

Ren, Hongyu, Jiang, Xiangqian, Gao, Feng and Zhang, Zonghua (2014) Absolute height measurement of specular surfaces with modified active fringe reflection photogrammetry. In: Proceedings of SPIE 9204, Interferometry XVII: Advanced Applications, 920408. SPIE, California, USA, 920408-1-920408-8.

Ren, Hongyu, Jiang, Xiangqian, Gao, Feng and Zhang, Zonghua (2014) Absolute height measurement of specular surfaces with modified active fringe reflection photogrammetry. In: Interferometry XVII: Advanced Applications. Proceedings of SPIE, 9204 (9204). SPIE, San Diego, California, USA, 920408-1-920408-8. ISBN 9781628412314

Ren, Hongyu, Jiang, Xiang and Gao, F. (2013) Simulation of Tri-sensor Deflectometry for Freeform and Structured Specular Surfaces. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2013 : CEARC'13. University of Huddersfield, Huddersfield, p. 236. ISBN 9781862181212

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Tang, Dawei, Gao, Feng and Jiang, Xiangqian (2016) Implementation of line-scan dispersive interferometry for defect detection. In: EUSPEN 16th International Conference & Exhibition, 30th May - 3rd June 2016, Nottingham, UK.

Tang, Dawei, Gao, F. and Jiang, Xiang (2014) White Light Channeled Spectrum Interferometry for the On-line Surface Inspection. In: The 3rd Annual EPSRC Manufacturing the Future Conference, 23 Sep-24 Sep 2014, Glasgow Science Centre, Glasgow, UK. (Unpublished)

Tang, Dawei, Gao, Feng and Jiang, Xiangqian (2014) On-line surface inspection using cylindrical lens-based spectral domain low-coherence interferometry. Applied Optics, 53 (24). pp. 5510-5516. ISSN 1559-128X

Tang, Dawei, Gao, Feng and Jiang, Xiangqian (2014) Cylindrical Lenses Based Spectral Domain Low-Coherence Interferometry for On-line Surface Inspection. In: Euspen 14th International Conference & Exhibition, 2nd - 6th June 2014, Dubrovnik, Croatia.

Tang, Dawei, Gao, F. and Jiang, Xiang (2013) Spectral Domain Low- Coherence Interferometry for On-line Surface Inspection. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2013 : CEARC'13. University of Huddersfield, Huddersfield, pp. 194-199. ISBN 9781862181212

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Xu, Yongjia, Gao, Feng, Zhang, Zonghua and Jiang, Xiang (2017) A calibration method for non-overlapping cameras based on mirrored phase target. In: The 13th International Symposium on Measurement Technology and Intelligent Instruments, 22-25 September 2017, Xi'an, Shaanxi, China. (Unpublished)

Xu, Yongjia, Gao, Feng, Ren, Hongyu, Zhang, Zonghua and Jiang, Xiangqian (2017) An iterative distortion compensation algorithm for camera calibration based on phase target. Sensors, 17 (6). p. 1188. ISSN 1424-8220

Xie, Lili, Huang, Shujun, Zhang, Zonghua, Gao, F. and Jiang, Xiang (2014) Projector calibration method based on optical coaxial camera. In: International Conference on Optoelectronic Technology and Application, 13-15 May 2014, Beijing, China.

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1993) A Fabry—Perot Interferometer for Measuring Micro-Displacement. ACTA Metrologica SINCA, 14 (2). pp. 94-98. ISSN 0894-0525

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) A High Precision Fold Fabry-Perot Interferometer for Measuring Displacement. In: National Geometric Metrology Symposium, 1990, Qingdao, China.

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) A High Precision Heterodyne Laser Interferometer for Measuring Micro-displacement. ACTA Metrologica SINICA, 11 (1). pp. 32-35.

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) Precise Determination of 633nm He-Ne Laser Wavelength in Air. In: 12th IMEKO World Congress Measurement and Progress DIGESE, 1990, Beijing, China.

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) A Laser Heterodyne Interferometer for Measuring Air Refractive Index. In: National Geometric Metrology Symposium, 1990, Qingdao, China.

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1989) A Laser Heterodyne Interferometer for Measuring Nanometer Displacement. In: 2nd IMEKO TC14 International Symposium on Metrology for Quality Control in Production, 1989, Beijing, China.

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Yu, Y, Huang, Shujun, Zhang, Zonghua, Gao, Feng and Jiang, Xiang (2014) The research of 3D small-field imaging system based on fringe projection technique. In: International Conference on Optoelectronic Technology and Application, 13-15 May 2014, Beijing, China.

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Zhao, Ping, Gao, Nan, Zhang, Zonghua, Gao, F. and Jiang, Xiang (2018) Performance analysis and evaluation of direct phase measuring deflectometry. Optics and lasers in engineering, 103. pp. 24-33. ISSN 0143-8166

Zhang, Zonghua, Wang, Yuemin, Huang, Shujun, Liu, Yue, Chang, Caixia, Gao, Feng and Jiang, Xiangqian (2017) Three-Dimensional Shape Measurements of Specular Objects Using Phase-Measuring Deflectometry. Sensors, 17 (12). p. 2835. ISSN 1424-8220

Zhang, Tao, Gao, Feng and Jiang, Xiang (2017) A method for inspecting double-sided high-sloped structured surfaces based on dual-probe wavelength scanning interferometer. In: The 13th International Symposium on Measurement Technology and Intelligent Instruments, 22-25 September 2017, Xi'an, Shaanxi, China. (Unpublished)

Zhang, Tao, Gao, Feng and Jiang, Xiangqian (2017) A surface topography acquisition method for double-sided near-right-angle structured surfaces based on dual-probe wavelength scanning interferometry. Optics Express, 25 (20). pp. 24148-214156. ISSN 1094-4087

Zhang, Zonghua, Huang, Shujun, Gao, Nan, Gao, F. and Jiang, Xiang (2017) Full-Field 3D Shape Measurement of Specular Object Having Discontinuous Surfaces. In: International Conference on Optical and Photonic Engineering (icOPEN 2017), 5-7 April 2017, Singapore.

Zhang, Zonghua, Liu, Y, Huang, Shujun, Niu, Z, Guo, J, Gao, N, Gao, Feng and Jiang, Xiang (2016) Full-Field 3D Shape Measurement of Specular Surfaces by Direct Phase to Depth Relationship. In: SPIE: Optical Metrology and Inspection for Industrial Applications IV, 12-14 October 2016, Beijing, China.

Zhang, Zonghua, Huang, Shujun, Meng, Shasha, Gao, Feng and Jiang, Xiangqian (2013) A simple, flexible and automatic 3D calibration method for a phase calculation-based fringe projection imaging system. Optics Express, 21 (10). p. 12218. ISSN 1094-4087