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Number of items: 46.

D

Dawei, Tang, Feng, Gao and Xiangqian, Jiang (2014) Cylindrical Lenses Based Spectral Domain Low-Coherence Interferometry for On-line Surface Inspection. In: Euspen 14th International Conference & Exhibition, 2nd - 6th June 2014, Dubrovnik, Croatia.

E

Elrawemi, Mohamed, Blunt, Liam, Muhamedsalih, Hussam, Fleming, Leigh and Gao, Feng (2014) Verification of an in Process Optical System based on High Resolution Interferometry for Detecting Flexible PV Barrier Films Defects. In: Photon14, 1-4 September 2014, Imperial College, London, UK. (In Press)

F

Feng, Gao, Wang, Xuanze and Jiang, Xiang (2012) A Digital Phase-Lock Method for AOD Scanning Measurement System. International Journal of Mechanic Systems Engineering, 2 (1). pp. 42-47. ISSN 2225-7403

G

Gao, F., Tang, Dawei and Jiang, Xiang (2013) White Light Spetral Interferometry for Real Time Surface Profile Measurement. In: ASPEN 2013, 12-15, November 2013, Taipei, Taiwan. (Unpublished)

Gao, F., Muhamedsalih, Hussam and Jiang, Xiang (2012) In-Process Fast Surface Measurement Using Wavelength Scanning Interferometry. Advanced Materials Research, 622-62. pp. 357-360. ISSN 1662-8985

Gao, F., Muhamedsalih, Hussam and Jiang, Xiang (2012) In-process fast surface measurement using wavelength scanning interferometry. In: 2012 International Conference on Manufacturing and Optimization , September 15-16, 2012, Beijing, China.

Gao, F., Muhamedsalih, Hussam and Jiang, Xiangqian (2012) Surface and thickness measurement of a transparent film using wavelength scanning interferometry. Optics Express, 20 (19). p. 21450. ISSN 1094-4087

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2011) Wavelength scanning interferometry for measuring transparent films of the fusion targets. In: 13th International Conference on Metrology and Properties of Engineering Surfaces 2011, 12th - 15th April 2011, Twickenham, UK.

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2010) Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford. (Unpublished)

Gao, F., Wang, Kaiwei and Jiang, Xiang (2009) A high speed scanning heterodyne interferometer for in process surface measurement. In: Proceedings of the euspen International Conference – San Sebastian - June 2009. European Society for Precision Engineering & Nanotechnology, San Sebastian, Spain. ISBN 13:978-0-9553082-6-0

Gao, F., Jiang, Xiang and Blunt, Liam (2009) Automated ballistic and tool mark identification. In: University of Huddersfield Research Festival, 23rd March - 2nd April 2009, University of Huddersfield. (Unpublished)

Gao, F., Leach, Richard K., Petzing, J and Coupland, J. M. (2008) Surface Measurement Errors using Commercial Scanning White Light Interferometers. Measurement Science and Technology, 19 (1). 015303. ISSN 0957-0233

Gao, F., Petzing, J, Coupland, J. M. and Leach, Richard K. (2007) Measurement of structured surface using stylus, AFM and optical methods. In: Metrology and properties of engineering surfaces: proceedings of the 11th international conference, Huddersfield, on 17th-20th July 2007. University of Huddersfield, Huddersfield, UK, p. 363. ISBN 1862180571

Gao, F., Coupland, J. M. and Petzing, J. (2006) V-groove measurement with white light interferometry. In: Photon06, 4-7 September, 2006, Manchester.

Gao, F. and Liu, X. (2000) A multi-functional tribological probe microscope for surface and surface related properties. In: The euspen nanotechnology workshop and Joint Warwick-Tokyo Nanotechnology Symposium, Sep. 2000, Warwick, UK.

Gao, F. and Liu, X (2000) Development of a new multi-function tribological Microscope. In: 1st euspen Topical Conference on Fabrication and Metrology in Nanotechnology and 2nd Annual General Meeting of euspen, 31 May - 2 June, 2000 , Copenhagen, Denmark.

Gao, F., Peng, G. and Koenders, L. (1998) Calibration of transfer standards for SPM. Microelectronic Engineering , 41 (42). pp. 615-618. ISSN 0167-9317

Gao, F., Peng, G., Zhao, X. and Koenders, L. (1997) Calibration of Standards and Application by SPM. In: The 9th International Precision Engineering Seminar, May 1997, Braunschweig, Germany. (Unpublished)

Gao, F., Harms, C., Zhao, X. and Koenders, L. (1997) Calibration of Standard Using a Scanning Probe Microscope. In: European Workshop on Micro-technology and Scanning Probe Microscope, 1997, Mainz, Germany .

Gao, F. (1993) A Reflective Optic Fiber Displacement Sensor. In: Young Scientists Symposium of National Institute of Metrology, 1993, Beijing, China.

Gao, F. and Xu, Y. (1991) The Study of a Fold Cavity Fabry-Perot Interferometer and it’s Phase. Optoelectronic Engineering, 20 (3). pp. 18-20. ISSN 1003-501X

Gao, F., Wang, B. and Zhuang, B. (1987) A Projection Photoelectric 2D Positioning System. In: National Symposium of Opto-Electronic technology, 1987, Jilin, China.

J

Jiang, Xiang, Gao, F. and Wang, Kaiwei (2010) Wavelength Scanning Interferometer for Structured Surfaces. In: ASPE Summer Topical Meeting on Precision Interferometric Metrology, 23rd - 25th June 2010, Asheville, North Carolina, USA.

Jiang, Xiang, Gao, F. and Mateboer, A. (2010) An approach of assessment for ultra-precision V-groove structured surfaces. In: Proceedings of the euspen International Conference – Delft - June 2010. European Society for Precision Engineering & Nanotechnology, Delft, Netherlands.

Jiang, Xiang, Wang, Kaiwei, Gao, F. and Muhamedsalih, Hussam (2010) Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise. Applied Optics, 49 (15). pp. 2903-2909. ISSN 1559-128X

L

Liang, Bo, Iwnicki, Simon, Gao, Feng, Ball, Andrew, Tran, Van Tung and Cattley, Robert (2013) Railway Wheel Flat and Rail Surface Defect Detection by Time-frequency Analysis. Chemical Engineering Transactions, 33. pp. 745-750. ISSN 1974-9791

Lobera, L, Gao, F., Petzing, J and Coupland, J. M. (2008) Limitations and Innovations in Scanning White Light Interferometry. In: euspen 10th Anniversary International Conference, 18-22 May 2008 , Zurich, Switzerland,.

Liu, X. and Gao, F. (2003) A novel multi-function tribological probe microscope for mapping surface properties. Measurement Science and Technology, 15 (1). pp. 91-102. ISSN 0957-0233

Liu, X., Bell, T., Gao, F. and Chetwynd, D. G. (2002) Characterisation of engineered surfaces by a multi-function tribological probe microscope. In: EUSPEN International Conference 2002. EUSPEN, pp. 719-722.

Liu, X. and Gao, F. (2001) Multi-function evaluation of surfaces at micro/nano scales by a new tribological probe microscope. In: 2nd euspen International Conference, 27-31, May 2001, Turin, Italy.

M

Muhamedsalih, Hussam, Jiang, Xiang and Gao, Feng (2013) Accelerated Surface Measurement Using Wavelength Scanning Interferometer with Compensation of Environmental Noise. Procedia CIRP, 10. pp. 70-76. ISSN 2212-8271

Muhamedsalih, Hussam, Gao, F. and Jiang, Xiang (2012) Comparison study of algorithms and accuracy in the wavelength scanning interferometry. Applied Optics, 51 (36). pp. 8854-8862. ISSN 0003-6935

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2012) Accelerated surface measurement using wavelength scanning interferometer with compensation of environmental noise. Procedia Engineering: 12th CIRP Conference on Computer Aided Tolerancing. ISSN 1877-7058 (In Press)

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2011) Comparison of fast Fourier transform and convolution in wavelength scanning interferometry. In: Proceedings of SPIE Volume 8082. SPIE Optical Metrology, 80820Q-80820Q.

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2011) Acceleration computing process in wavelength scanning interferometry. In: 10th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2011) , 29th June - 2nd July 2011, Daejeon, S. Korea. (Unpublished)

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2010) Vibration compensation of wavelength scanning interferometer for in-process surface inspection. In: Future Technologies in Computing and Engineering: Proceedings of Computing and Engineering Annual Researchers' Conference 2010: CEARC’10. University of Huddersfield, Huddersfield, pp. 148-153. ISBN 9781862180932

Muhamedsalih, Hussam, Jiang, Xiang and Gao, F. (2009) Interferograms analysis for wavelength scanning interferometer using convolution and fourier transform. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2009: CEARC’09. University of Huddersfield, Huddersfield, pp. 33-37. ISBN 9781862180857

R

Ren, Hongyu, Jiang, Xiang and Gao, F. (2013) Simulation of Tri-sensor Deflectometry for Freeform and Structured Specular Surfaces. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2013 : CEARC'13. University of Huddersfield, Huddersfield, p. 236. ISBN 9781862181212

T

Tang, Dawei, Gao, F. and Jiang, Xiang (2013) Spectral Domain Low- Coherence Interferometry for On-line Surface Inspection. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2013 : CEARC'13. University of Huddersfield, Huddersfield, pp. 194-199. ISBN 9781862181212

X

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1993) A Fabry—Perot Interferometer for Measuring Micro-Displacement. ACTA Metrologica SINCA, 14 (2). pp. 94-98. ISSN 0894-0525

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) A High Precision Fold Fabry-Perot Interferometer for Measuring Displacement. In: National Geometric Metrology Symposium, 1990, Qingdao, China .

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) A High Precision Heterodyne Laser Interferometer for Measuring Micro-displacement. ACTA Metrologica SINICA, 11 (1). pp. 32-35.

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) Precise Determination of 633nm He-Ne Laser Wavelength in Air. In: 12th IMEKO World Congress Measurement and Progress DIGESE, 1990, Beijing, China .

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1990) A Laser Heterodyne Interferometer for Measuring Air Refractive Index. In: National Geometric Metrology Symposium, 1990, Qingdao, China .

Xu, Y., Ye, X., Xu, J., Li, C. and Gao, F. (1989) A Laser Heterodyne Interferometer for Measuring Nanometer Displacement. In: 2nd IMEKO TC14 International Symposium on Metrology for Quality Control in Production, 1989, Beijing, China.

Z

Zhang, Zonghua, Huang, Shujun, Meng, Shasha, Gao, Feng and Jiang, Xiangqian (2013) A simple, flexible and automatic 3D calibration method for a phase calculation-based fringe projection imaging system. Optics Express, 21 (10). p. 12218. ISSN 1094-4087

This list was generated on Mon Sep 1 12:35:16 2014 IST.

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