A multi-functional tribological probe microscope for surface and surface related properties

Gao, F. and Liu, X. (2000) A multi-functional tribological probe microscope for surface and surface related properties. In: The euspen nanotechnology workshop and Joint Warwick-Tokyo Nanotechnology Symposium, Sep. 2000, Warwick, UK.

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URI:

https://eprints.hud.ac.uk/id/eprint/7981

URI:

https://eprints.hud.ac.uk/id/eprint/7981

URI:

https://eprints.hud.ac.uk/id/eprint/7981

URI:

https://eprints.hud.ac.uk/id/eprint/7981

URI:

https://eprints.hud.ac.uk/id/eprint/7981

URI:

https://eprints.hud.ac.uk/id/eprint/7981

URI:

https://eprints.hud.ac.uk/id/eprint/7981

URI:

https://eprints.hud.ac.uk/id/eprint/7981

URI:

https://eprints.hud.ac.uk/id/eprint/7981

URI:

https://eprints.hud.ac.uk/id/eprint/7981

URI:

https://eprints.hud.ac.uk/id/eprint/7981

Title:

A multi-functional tribological probe microscope for surface and surface related properties

Creators:

Gao, F. and Liu, X.

Date:

September 2000

Subjects:

T Technology > TJ Mechanical engineering and machinery
Q Science > QC Physics

Schools:

School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

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Item Type:

Conference or Workshop Item

Presentation Type:

Paper

Depositing User:

Feng Gao

Date Deposited:

06 Jul 2010 12:53

Revision:

Last Modified:

28 Aug 2021 10:57

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