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Measurement of structured surface using stylus, AFM and optical methods

Gao, F., Petzing, J, Coupland, J. M. and Leach, Richard K. (2007) Measurement of structured surface using stylus, AFM and optical methods. In: Metrology and properties of engineering surfaces: proceedings of the 11th international conference, Huddersfield, on 17th-20th July 2007. University of Huddersfield, Huddersfield, UK, p. 363. ISBN 1862180571
Information
URI:
https://eprints.hud.ac.uk/id/eprint/7976
Title:
Measurement of structured surface using stylus, AFM and optical methods
Creators:
Gao, F., Petzing, J, Coupland, J. M. and Leach, Richard K.
Editors:
Blunt, Liam
Date:
17 July 2007
Subjects:
T Technology > TJ Mechanical engineering and machinery
Q Science > QC Physics
Schools:
School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Library
Item Type:
Book Chapter
Presentation Type:
Poster
Depositing User:
Feng Gao
Date Deposited:
06 Jul 2010 09:06
Revision:
17
Last Modified:
28 Aug 2021 10:57
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