Measurement of structured surface using stylus, AFM and optical methods

Gao, F., Petzing, J, Coupland, J. M. and Leach, Richard K. (2007) Measurement of structured surface using stylus, AFM and optical methods. In: Metrology and properties of engineering surfaces: proceedings of the 11th international conference, Huddersfield, on 17th-20th July 2007. University of Huddersfield, Huddersfield, UK, p. 363. ISBN 1862180571

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URI:

https://eprints.hud.ac.uk/id/eprint/7976

URI:

https://eprints.hud.ac.uk/id/eprint/7976

URI:

https://eprints.hud.ac.uk/id/eprint/7976

URI:

https://eprints.hud.ac.uk/id/eprint/7976

URI:

https://eprints.hud.ac.uk/id/eprint/7976

URI:

https://eprints.hud.ac.uk/id/eprint/7976

URI:

https://eprints.hud.ac.uk/id/eprint/7976

URI:

https://eprints.hud.ac.uk/id/eprint/7976

URI:

https://eprints.hud.ac.uk/id/eprint/7976

URI:

https://eprints.hud.ac.uk/id/eprint/7976

URI:

https://eprints.hud.ac.uk/id/eprint/7976

Title:

Measurement of structured surface using stylus, AFM and optical methods

Creators:

Gao, F., Petzing, J, Coupland, J. M. and Leach, Richard K.

Editors:

Blunt, Liam

Date:

17 July 2007

Subjects:

T Technology > TJ Mechanical engineering and machinery
Q Science > QC Physics

Schools:

School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

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Item Type:

Book Chapter

Presentation Type:

Poster

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Date Deposited:

06 Jul 2010 09:06

Revision:

17

Last Modified:

28 Aug 2021 10:57

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