Precision and Nanoscale Surface Metrology

Blunt, Liam; Jiang, Xiang; Scott, Paul J.

Precision and Nanoscale Surface Metrology

Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2009) Precision and Nanoscale Surface Metrology. In: International Moulded Optics Conference,, 19-20th Nov 2009, Breman Germany. (Unpublished)

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URI:

https://eprints.hud.ac.uk/id/eprint/7645

Title:

Precision and Nanoscale Surface Metrology

Creators:

Blunt, Liam, Jiang, Xiang and Scott, Paul J.

Official URL:

http://www.imoc-conferences.de/program.htm

Date:

November 2009

Subjects:

T Technology > TJ Mechanical engineering and machinery

Schools:

School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

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Item Type:

Conference or Workshop Item

Presentation Type:

Keynote

Depositing User:

Liam Blunt

Date Deposited:

18 May 2010 15:07

Revision:

13

Last Modified:

28 Aug 2021 10:56

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