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Precision and Nanoscale Surface Metrology
Blunt, Liam
,
Jiang, Xiang
and
Scott, Paul J.
(2009)
Precision and Nanoscale Surface Metrology.
In: International Moulded Optics Conference,, 19-20th Nov 2009, Breman Germany. (Unpublished)
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Information
URI:
https://eprints.hud.ac.uk/id/eprint/7645
Title:
Precision and Nanoscale Surface Metrology
Creators:
Blunt, Liam
,
Jiang, Xiang
and
Scott, Paul J.
Official URL:
http://www.imoc-conferences.de/program.htm
Date:
November 2009
Subjects:
T Technology
>
TJ Mechanical engineering and machinery
Schools:
School of Computing and Engineering
School of Computing and Engineering
>
Centre for Precision Technologies
School of Computing and Engineering
>
Centre for Precision Technologies
>
Surface Metrology Group
Library
Item Type:
Conference or Workshop Item
Presentation Type:
Keynote
Depositing User:
Liam Blunt
Date Deposited:
18 May 2010 15:07
Revision:
13
Last Modified:
28 Aug 2021 10:56
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