A new framework for Charactersation of Complex Structured Surface

Zeng, Wenhan, Lou, Shan, Jiang, Xiangqian and Scott, Paul J. (2017) A new framework for Charactersation of Complex Structured Surface. In: Met & Props 2017, 27th-29th June 2017, Gothenburg, Sweeden. (In Press)

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URI:

https://eprints.hud.ac.uk/id/eprint/32518

URI:

https://eprints.hud.ac.uk/id/eprint/32518

URI:

https://eprints.hud.ac.uk/id/eprint/32518

URI:

https://eprints.hud.ac.uk/id/eprint/32518

URI:

https://eprints.hud.ac.uk/id/eprint/32518

URI:

https://eprints.hud.ac.uk/id/eprint/32518

URI:

https://eprints.hud.ac.uk/id/eprint/32518

URI:

https://eprints.hud.ac.uk/id/eprint/32518

URI:

https://eprints.hud.ac.uk/id/eprint/32518

URI:

https://eprints.hud.ac.uk/id/eprint/32518

URI:

https://eprints.hud.ac.uk/id/eprint/32518

Title:

A new framework for Charactersation of Complex Structured Surface

Creators:

Zeng, Wenhan, Lou, Shan, Jiang, Xiangqian and Scott, Paul J.

Date:

26 May 2017

Subjects:

T Technology > TJ Mechanical engineering and machinery

Schools:

School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

Uncontrolled Keywords:

complex structured surface, diffusion filter, PDE filter, Pattern analysis, robust filtration

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Item Type:

Conference or Workshop Item

Presentation Type:

Paper

Depositing User:

Wenhan Zeng

Date Deposited:

09 Aug 2017 12:29

Revision:

Last Modified:

28 Aug 2021 15:47

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