CNC Polishing and Metrology – from E-ELT Segments to Commercial Optics

Walker, David D. (2016) CNC Polishing and Metrology – from E-ELT Segments to Commercial Optics. In: Academic seminar by Prof David Walker: The Institute of Optics And Electronics, The chinese Academy of Sciences:, 6-8 June 2016, Chengdu, China. (Unpublished)

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Abstract

Context – Science-drivers and the E-ELT project
Mirror segments – a unique approach
Problems experienced … and solutions
On-machine metrology versus a separate metrology station
New developments
Conclusion

Information

URI:

https://eprints.hud.ac.uk/id/eprint/29923

Title:

CNC Polishing and Metrology – from E-ELT Segments to Commercial Optics

Creators:

Walker, David D.

Contributors: