Future developments in surface metrology

Blunt, Liam; Jiang, Xiang; Scott, Paul J.

Future developments in surface metrology

Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2003) Future developments in surface metrology. In: Advanced Techniques for Assessment Surface Topography. Kogan Page, London, pp. 339-347. ISBN 1903996112

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URI:

https://eprints.hud.ac.uk/id/eprint/2756

Title:

Future developments in surface metrology

Creators:

Blunt, Liam, Jiang, Xiang and Scott, Paul J.

Editors:

Blunt, Liam and Jiang, Xiang

Date:

2003

Subjects:

T Technology > T Technology (General)
Q Science > QA Mathematics

Schools:

School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

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Item Type:

Book Chapter

Depositing User:

Briony Heyhoe

Date Deposited:

25 Nov 2008 16:11

Revision:

14

Last Modified:

28 Aug 2021 10:43

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