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Future developments in surface metrology

Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2003) Future developments in surface metrology. In: Advanced Techniques for Assessment Surface Topography. Kogan Page, London, pp. 339-347. ISBN 1903996112
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Title:
Future developments in surface metrology
Creators:
Blunt, Liam, Jiang, Xiang and Scott, Paul J.
Editors:
Blunt, Liam and Jiang, Xiang
Date:
2003
Subjects:
T Technology > T Technology (General)
Q Science > QA Mathematics
Schools:
School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Library
Item Type:
Book Chapter
Depositing User:
Briony Heyhoe
Date Deposited:
25 Nov 2008 16:11
Revision:
14
Last Modified:
28 Aug 2021 10:43
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