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Wavelength Scanning Interferometry for PV Production In-line Metrology

Elrawemi, Mohamed, Blunt, Liam, Fleming, Leigh, Muhamedsalih, Hussam and Gao, F. (2014) Wavelength Scanning Interferometry for PV Production In-line Metrology. In: 3rd Annual EPSRC Manufacturing the Future Conference, 23rd – 24th September 2014, Glasgow Science Centre, Glasgow, UK.
Abstract

Flexible PV modules are manufactured using roll to roll (R2R) technology. These modules require a flexible barrier material to prevent water vapor ingress.

Information
URI:
https://eprints.hud.ac.uk/id/eprint/21648
URI:
https://eprints.hud.ac.uk/id/eprint/21648
Title:
Wavelength Scanning Interferometry for PV Production In-line Metrology
Creators:
Elrawemi, Mohamed, Blunt, Liam, Fleming, Leigh, Muhamedsalih, Hussam and Gao, F.
Date:
23 September 2014
Subjects:
T Technology > TS Manufactures
Schools:
School of Computing and Engineering > Centre for Precision Technologies > EPSRC Centre for Innovative Manufacturing in Advanced Metrology
School of Computing and Engineering
Library
Item Type:
Conference or Workshop Item
Presentation Type:
Poster
Depositing User:
Mohamed Elrawemi
Date Deposited:
02 Oct 2014 11:23
Revision:
236
Last Modified:
28 Aug 2021 18:55
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