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Single ion induced spike effects on thin metal films: observation and simulation

Donnelly, S. E., Birtcher, R. C. and Nordlund, K. (2005) Single ion induced spike effects on thin metal films: observation and simulation. In: Engineering thin films and nanostructures with ion beams. Taylor & Francis, pp. 7-78. ISBN 9781420028294
Information
URI:
https://eprints.hud.ac.uk/id/eprint/18758
Title:
Single ion induced spike effects on thin metal films: observation and simulation
Creators:
Donnelly, S. E., Birtcher, R. C. and Nordlund, K.
Editors:
Knystautas, E
Date:
April 2005
Subjects:
Q Science > QC Physics
Schools:
School of Computing and Engineering > Electron Microscopy and Materials Analysis
Library
Item Type:
Book Chapter
Depositing User:
Graeme Greaves
Date Deposited:
03 Oct 2013 08:13
Revision:
9
Last Modified:
28 Aug 2021 11:32
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