Xie, F., Zhang, W., Jiang, Xiang, Zhang, L. and Bennion, Ian (2003) Novel spatial scanning technique for surface roughness measurement. Lasers and Electro-Optics Society, IEEELEOS, 1 (27-28). pp. 97-98.

We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique