Skip to main content

Novel spatial scanning technique for surface roughness measurement

Xie, F., Zhang, W., Jiang, Xiang, Zhang, L. and Bennion, Ian (2003) Novel spatial scanning technique for surface roughness measurement. Lasers and Electro-Optics Society, IEEELEOS, 1 (27-28). pp. 97-98.
Abstract

We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique

Library
Item Type:
Article
Depositing User:
Briony Heyhoe
Date Deposited:
29 Aug 2008 14:34
Revision:
17
Last Modified:
28 Aug 2021 10:40
Statistics
CORE (COnnecting REpositories)
Tools