Novel spatial scanning technique for surface roughness measurement

Xie, F.; Zhang, W.; Jiang, Xiang; Zhang, L.; Bennion, Ian

Novel spatial scanning technique for surface roughness measurement

Xie, F., Zhang, W., Jiang, Xiang, Zhang, L. and Bennion, Ian (2003) Novel spatial scanning technique for surface roughness measurement. Lasers and Electro-Optics Society, IEEELEOS, 1 (27-28). pp. 97-98.

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Abstract

We present the first spatial scanning system using wavelength-spatial transformation of chromatic dispersion device. Optical probe used in fiber optic interferometer for surface measurement is demonstrated by using diffraction grating and wavelength scanning technique

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URI:

https://eprints.hud.ac.uk/id/eprint/1699

Title:

Novel spatial scanning technique for surface roughness measurement

Creators:

Xie, F., Zhang, W., Jiang, Xiang, Zhang, L. and Bennion, Ian

Identification Number:

10.1109/LEOS.2003.1251618

Official URL:

http://dx.doi.org/10.1109/LEOS.2003.1251618

Date: