Metrological characteristics of complex wavelet transform for surface topography analysis

Zeng, Wenhan, Jiang, Xiang, Scott, Paul J. and Blunt, Liam (2005) Metrological characteristics of complex wavelet transform for surface topography analysis. In: 5th euspen International Conference, 9th-12th May 2005, Montpellier, France. (Unpublished)

Information
Library
Statistics

Information

URI:

https://eprints.hud.ac.uk/id/eprint/1442

URI:

https://eprints.hud.ac.uk/id/eprint/1442

URI:

https://eprints.hud.ac.uk/id/eprint/1442

URI:

https://eprints.hud.ac.uk/id/eprint/1442

URI:

https://eprints.hud.ac.uk/id/eprint/1442

URI:

https://eprints.hud.ac.uk/id/eprint/1442

URI:

https://eprints.hud.ac.uk/id/eprint/1442

URI:

https://eprints.hud.ac.uk/id/eprint/1442

URI:

https://eprints.hud.ac.uk/id/eprint/1442

Title:

Metrological characteristics of complex wavelet transform for surface topography analysis

Creators:

Zeng, Wenhan, Jiang, Xiang, Scott, Paul J. and Blunt, Liam

Date:

May 2005

Subjects:

T Technology > T Technology (General)
Q Science > QC Physics

Schools:

School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

Library

Item Type:

Conference or Workshop Item

Presentation Type:

Paper

Depositing User:

Date Deposited:

08 Aug 2008 15:30

Revision:

16

Last Modified:

28 Aug 2021 10:40

Statistics

CORE (COnnecting REpositories)

CORE (COnnecting REpositories)

Tools

Add to Any

Add to Email