Geometrical characterisation of MST and microfluidic devices using novel surface metrology techniques

Blunt, Liam, Xiao, Shaojun, Jiang, Xiang and Scott, Paul J. (2005) Geometrical characterisation of MST and microfluidic devices using novel surface metrology techniques. In: 5th euspen International Conference, 9th-12th May 2005, Montpellier, France. (Unpublished)

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URI:

https://eprints.hud.ac.uk/id/eprint/1134

URI:

https://eprints.hud.ac.uk/id/eprint/1134

URI:

https://eprints.hud.ac.uk/id/eprint/1134

Title:

Geometrical characterisation of MST and microfluidic devices using novel surface metrology techniques

Creators:

Blunt, Liam, Xiao, Shaojun, Jiang, Xiang and Scott, Paul J.

Date:

May 2005

Subjects:

T Technology > T Technology (General)
T Technology > TA Engineering (General). Civil engineering (General)

Schools:

School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

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Item Type:

Conference or Workshop Item

Presentation Type:

Poster

Depositing User:

Date Deposited:

21 Jul 2008 10:11

Revision:

15

Last Modified:

28 Aug 2021 10:39

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