A Chip Device For On-line Assessment In Nano-scale Surface Manufacture

Yang, Shuming (2009) A Chip Device For On-line Assessment In Nano-scale Surface Manufacture. In: University of Huddersfield Research Festival, 23rd March - 2nd April 2009, University of Huddersfield. (Unpublished)

Preview

PDF - Accepted Version Download (884kB) | Preview

Abstract

This project aims to create a novel system based on interferometry and
wavelength spatial scanning techniques using breakthrough micro-/nanotechnology
and optical methodologies. The system will be used for online
nano-scale surface measurement, which represents an important step
change in the fields of surface metrology.

Item Type:	Conference or Workshop Item (Poster)
Subjects:	T Technology > TA Engineering (General). Civil engineering (General)
Schools:	School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Depositing User:	Cherry Edmunds
Date Deposited:	22 Jul 2009 07:53
Last Modified:	06 Apr 2018 16:54
URI:	http://eprints.hud.ac.uk/id/eprint/5204

Downloads

Repository Staff Only: item control page

View Item