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CNC Polishing and Metrology – from E-ELT Segments to Commercial Optics

Walker, David D. (2016) CNC Polishing and Metrology – from E-ELT Segments to Commercial Optics. In: Academic seminar by Prof David Walker: The Institute of Optics And Electronics, The chinese Academy of Sciences:, 6-8 June 2016, Chengdu, China. (Unpublished)

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Abstract

Context – Science-drivers and the E-ELT project
Mirror segments – a unique approach
Problems experienced … and solutions
On-machine metrology versus a separate metrology station
New developments
Conclusion

Item Type: Conference or Workshop Item (Lecture)
Contributors:
ContributionNameEmailORCID
AuthorUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords: optics manufacturing telescope robot automation
Subjects: Q Science > QC Physics
T Technology > TA Engineering (General). Civil engineering (General)
T Technology > TJ Mechanical engineering and machinery
T Technology > TS Manufactures
Schools: School of Computing and Engineering > Centre for Precision Technologies > Advanced Machining Technology Group
School of Computing and Engineering
Related URLs:
Depositing User: David Walker
Date Deposited: 10 Nov 2016 11:45
Last Modified: 10 Nov 2016 11:45
URI: http://eprints.hud.ac.uk/id/eprint/29923

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