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A New Method to Characterize the Structured Tessellation Surface

Zeng, Wenhan, Jiang, Xiangqian, Scott, Paul J. and Li, Tukun (2013) A New Method to Characterize the Structured Tessellation Surface. Procedia CIRP, 10. pp. 155-161. ISSN 2212-8271

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Tessellated structure surface has been widely used for engineering surface. However, comprehensive characterization method for tessellated structure surface does not exist. In this paper, a systematic method that based on lattice building combined with the spectral analysis for the characterization of tessellation surface is introduced. The basic procedure includes six steps: pre-processing the measured data; converting the filtered data to AACF domain; finding the peak and the translation vectors; building the lattice and classifying the lattice type; tessellation reconstruction and finally comparison. Experimental works verified the effectiveness of the proposed method.

Item Type: Article
Subjects: T Technology > TJ Mechanical engineering and machinery
Schools: School of Computing and Engineering > Centre for Precision Technologies > EPSRC Centre for Innovative Manufacturing in Advanced Metrology
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Depositing User: Tukun Li
Date Deposited: 24 Sep 2013 12:16
Last Modified: 28 Aug 2021 19:40


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