An in-situ TEM study of the effects of 6 keV He ion irradiation on Si and SiO2

Donnelly, S. E., Hinks, J. A., Pawley, C J, Abrams, K J and Van den Berg, Jakob (2012) An in-situ TEM study of the effects of 6 keV He ion irradiation on Si and SiO2. Journal of Physics: Conference Series, 371. 012045. ISSN 1742-6596

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Item Type:	Article
Subjects:	Q Science > Q Science (General) Q Science > QC Physics
Schools:	School of Computing and Engineering School of Computing and Engineering > Electron Microscopy and Materials Analysis
Related URLs:	Author
Depositing User:	Jonathan Hinks
Date Deposited:	27 Nov 2012 16:07
Last Modified:	28 Aug 2021 20:20
URI:	https://eprints.hud.ac.uk/id/eprint/16008

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