Donnelly, S. E., Hinks, J. A., Pawley, C J, Abrams, K J and Van den Berg, Jakob (2012) An in-situ TEM study of the effects of 6 keV He ion irradiation on Si and SiO2. Journal of Physics: Conference Series, 371. 012045. ISSN 1742-6596
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Official URL: http://dx.doi.org/10.1088/1742-6596/371/1/012045
Item Type: | Article |
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Subjects: | Q Science > Q Science (General) Q Science > QC Physics |
Schools: | School of Computing and Engineering School of Computing and Engineering > Electron Microscopy and Materials Analysis |
Related URLs: | |
Depositing User: | Jonathan Hinks |
Date Deposited: | 27 Nov 2012 16:07 |
Last Modified: | 28 Aug 2021 20:20 |
URI: | http://eprints.hud.ac.uk/id/eprint/16008 |
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