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Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2009) Precision and Nanoscale Surface Metrology. In: International Moulded Optics Conference,, 19-20th Nov 2009, Breman Germany . (Unpublished)
Metadata only available from this repository.Official URL: http://www.imoc-conferences.de/program.htm
| Item Type: | Conference or Workshop Item (Keynote) |
|---|---|
| Subjects: | T Technology > TJ Mechanical engineering and machinery |
| Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
| Related URLs: | |
| Depositing User: | Liam Blunt |
| Date Deposited: | 18 May 2010 16:07 |
| Last Modified: | 26 Nov 2010 09:58 |
| URI: | http://eprints.hud.ac.uk/id/eprint/7645 |
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