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Precision and Nanoscale Surface Metrology

Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2009) Precision and Nanoscale Surface Metrology. In: International Moulded Optics Conference,, 19-20th Nov 2009, Breman Germany . (Unpublished)

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Item Type: Conference or Workshop Item (Keynote)
Subjects: T Technology > TJ Mechanical engineering and machinery
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Liam Blunt
Date Deposited: 18 May 2010 16:07
Last Modified: 26 Nov 2010 09:58
URI: http://eprints.hud.ac.uk/id/eprint/7645

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