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Morphological method for surface metrology and dimensional metrology based on the alpha shape

Jiang, Xiang, Lou, Shan and Scott, Paul J. (2011) Morphological method for surface metrology and dimensional metrology based on the alpha shape. Measurement Science and Technology, 23 (1). 015003. ISSN 0957-0233

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    Abstract

    Morphological filters are useful tools as they are commonly employed in surface metrology and dimensional metrology, serving for surface texture analysis and data smoothing respectively. Compared to the mean-line filtering techniques, such as the Gaussian filter, morphological filters have the merits of compact support, no need to remove form, and being relevant to geometrical properties of surfaces. This paper proposes a novel morphological method based on the alpha shape. The proposed method has the advantages over the traditional methods that it runs relative fast, enables arbitrary large ball radii, and applies to freeform surfaces and nonuniform sampled surfaces. The theory of basic morphological operations and the alpha shape are introduced and the theoretical link between the alpha hull and the morphological closing and opening operation is presented. A practical algorithm is developed that corrects possible singularities caused by data spikes and reduces the amount of calculation for open profiles/surfaces. Computer simulation is used to compare the results from the traditional algorithm and the proposed one. Experimental studies are conducted to demonstrate the feasibility and applicability of using the proposed method.

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    Item Type: Article
    Additional Information: IOPSelect paper (Articles from the last 12 months that have been chosen by our editors for their novelty, significance and potential impact on future research. All select articles are first published in the source journals.).
    Subjects: T Technology > TJ Mechanical engineering and machinery
    Schools: School of Computing and Engineering
    School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
    School of Computing and Engineering > Centre for Precision Technologies > EPSRC Centre for Innovative Manufacturing in Advanced Metrology
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    References:

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    Depositing User: Shan Lou
    Date Deposited: 05 Jan 2012 16:15
    Last Modified: 21 Jan 2013 16:20
    URI: http://eprints.hud.ac.uk/id/eprint/12177

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