Items where Author is Chen, Xiaomei

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Chen, Xiaomei, Longstaff, Andrew P., Fletcher, Simon and Myers, Alan (2014) Deployment and evaluation of a dual-sensor autofocusing method for on-machine measurement of patterns of small holes on freeform surfaces. Applied Optics, 53 (10). pp. 2246-2255. ISSN 1559-128X

Chen, Xiaomei, Longstaff, Andrew P., Fletcher, Simon and Myers, Alan (2014) Analysing and evaluating a dual-sensor autofocusing method for measuring the position of patterns of small holes on complex curved surfaces. Sensors and Actuators A: Physical, 210. pp. 86-94. ISSN 0924-4247

Chen, Xiaomei and Koenders, Ludger (2014) A novel pitch evaluation of one-dimensional gratings based on a cross-correlation filter. Measurement Science and Technology, 25 (4). 044007. ISSN 0957-0233

Chen, Xiaomei, Longstaff, Andrew P., Parkinson, Simon and Myers, Alan (2014) A Method for Rapid Detection and Evaluation of Position Errors of Patterns of Small Holes on Complex Curved and Freeform Surfaces. International Journal of Precision Engineering and Manufacturing, 15 (2). pp. 209-217. ISSN 2234-7593

Chen, Xiaomei and Koenders, Ludger (2013) A novel pitch evaluation method based on a cross-correlation filter. In: Nanoscale 2013, 25-26, April 2013, Paris, France. (Unpublished)

Chen, Xiaomei, Longstaff, Andrew P., Fletcher, Simon and Myers, Alan (2013) Evaluation of measurement technique for a precision aspheric artefact using a nano-measuring machine. In: Laser Metrology and Machine Performance X. Euspen, Euspen Headquarters, Bedfordshire, MK43 0AL, UK, pp. 357-364. ISBN 978-0-9566790-1-7

Chen, Xiaomei, Wolff, Helmut and Koenders, Ludger (2012) Atomic force microscope cantilevers as encoder for real-time displacement measurements. Proceedings of SPIE - SPIE Defense, Security + Sensing, Baltimore, Md., 23-27, April, 2012, USA, 8378 (923005). 83780C-83780C. ISSN 0277786X

Chen, Xiaomei, Koenders, Ludger, Wolff, Helmut, Neddermeyer, Holger and Haertig, Frank (2011) Atomic force microscope cantilevers as encoders for real-time forward and backward displacement measurements. Measurement Science and Technology, 22 (9). 094017. ISSN 0957-0233

Chen, Xiaomei, Koenders, Ludger and Härtig, Frank (2011) Real-time cross-correlation filtering of a one-dimensional grating position-encoded signal. Measurement Science and Technology, 22 (8). 085105. ISSN 0957-0233

Chen, Xiaomei (2011) Atomic Force Microscope (AFM) Cantilevers as Encoder for Real-Time Displacement Measurements. Mensch und Buch, Berlin, Germany. ISBN 978 3 86387 079 9

Chen, Xiaomei, Koenders, Ludger, Wolff, Helmut and Härtig, Frank (2011) Tuning-Fork Atomic Force Microscope Cantilever Encoder and Applications for Displacement and In-Plane Rotation Angle Measurement. Procedia Engineering: Proceedings of Eurosensors XXV, September 4-7, 2011, Athens, Greece, 25. pp. 555-558. ISSN 1877-7058

Chen, Xiaomei, Wan, Yu, Koenders, Ludger and Schilling, Meinhard (2010) Measurements of dimensional standards and etalons with feature size from tens of micrometres to millimetres by using sensor strengthened nanomeasuring machine. Measurement, 43 (10). pp. 1369-1375. ISSN 02632241

Chen, Xiaomei, Koenders, Ludger, Wolff, Helmut, Haertig, Frank and Schilling, Meinhard (2010) Atomic force microscope cantilever as an encoding sensor for real-time displacement measurement. Measurement Science and Technology, 21 (10). p. 105205. ISSN 0957-0233

Chen, Xiaomei, Ma, Xiaosu, Zhu, Zhenyu and Yang, Deliang (2008) Development of SFM of probing sensor look-alike. Journal of Electronic Measurement and Instrument, 22 (Z2). pp. 359-365. ISSN 1000-7105

Chen, Xiaomei, Grattan, K.T.V. and Dooley, R.Larry (2002) Optically interferometric roughness measurements for spherical surfaces by processing two microscopic interferograms. Measurement, 32 (2). pp. 109-115. ISSN 0263-2241

Cao, Hang, Chen, Xiaomei, Grattan, K.T.V. and Sun, Yujiu (2002) Automatic micro dimension measurement using image processing methods. Measurement, 31 (2). pp. 71-76. ISSN 02632241

Chen, Xiaomei, Cao, Hang, Zhou, Zili and Qi, Aihui (1998) Design of a Laser Heterodyne Interferometer for 2-D Nanometer Scale Measurement. Optoelectronic Engineering, 25 (1). pp. 18-22. ISSN 1003-501X

Chen, Xiaomei, Ren, Dongmei and Li, Zhijun (1997) Surface Roughness interferogram processing system. Metrology & Measurement Technology, 17 (3). pp. 7-10. ISSN 1002-6061

Chen, Xiaomei (1994) Threshold Optimization of interference image of surface roughness measuring interferometer. Acta Optica Sinica, 14 (11). pp. 1183-1186. ISSN 0253-2239

Chen, Xiaomei and Long, Zuhong (1993) Automatic processing of interferogram from surface roughness measuring interferometer. Acta Optica Sinica, 13 (11). pp. 1040-1044. ISSN 0253-2239

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Forsyth, David I., Wade, Scott A., Sun, Tong, Chen, Xiaomei and Grattan, Kenneth T. V. (2002) Dual Temperature and Strain Measurement with the Combined Fluorescence Lifetime and Bragg Wavelength Shift Approach in Doped Optical Fiber. Applied Optics, 41 (31). p. 6585. ISSN 0003-6935

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Marsh, John H., Chiou, Arthur E. T., Asundi, Anand K., Sidorin, Yakov S., Osinski, Marek, Grattan, Kenneth T. V., Wade, Scott A., Forsyth, David, Sun, Tong, Chen, Xiaomei, Bhattacharya, Pallab, Podbielska, Halina, Osten, Wolfgang, Tang, Ding Y., Chua, Soo-Jin, Ishibashi, Akira, Varadan, Vijay K., Jacques, Steven L. and Wada, Osamu (2001) Combined fluorescence decay time and fiber Bragg grating temperature and strain sensing. Proceedings of SPIE, 4596. pp. 90-96. ISSN 9780819443267

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Yang, Tao, Zuo, Yong and Chen, Xiaomei (2009) Auto-focus technology and its application based on image processing. Computer Simulation, 26 (7). pp. 256-259. ISSN 1006-9348