Calibration of Standard Using a Scanning Probe Microscope

Gao, F.; Harms, C.; Zhao, X.; Koenders, L.

Calibration of Standard Using a Scanning Probe Microscope

Gao, F., Harms, C., Zhao, X. and Koenders, L. (1997) Calibration of Standard Using a Scanning Probe Microscope. In: European Workshop on Micro-technology and Scanning Probe Microscope, 1997, Mainz, Germany.

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URI:

https://eprints.hud.ac.uk/id/eprint/7992

Title:

Calibration of Standard Using a Scanning Probe Microscope

Creators:

Gao, F., Harms, C., Zhao, X. and Koenders, L.

Date:

January 1997

Subjects:

Q Science > QC Physics

Schools:

School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

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Item Type:

Conference or Workshop Item

Presentation Type:

Paper

Depositing User:

Feng Gao

Date Deposited:

06 Jul 2010 13:19

Revision:

11

Last Modified:

28 Aug 2021 10:57

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