Wavelength Scanning Interferometer for Structured Surfaces

Jiang, Xiang, Gao, F. and Wang, Kaiwei (2010) Wavelength Scanning Interferometer for Structured Surfaces. In: ASPE Summer Topical Meeting on Precision Interferometric Metrology, 23rd - 25th June 2010, Asheville, North Carolina, USA.

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URI:

https://eprints.hud.ac.uk/id/eprint/7967

Title:

Wavelength Scanning Interferometer for Structured Surfaces

Creators:

Jiang, Xiang, Gao, F. and Wang, Kaiwei

Official URL:

http://www.aspe.net/meetings/2010_Summer/2010_Summ...

Date:

23 June 2010

Subjects:

T Technology > TS Manufactures
T Technology > TJ Mechanical engineering and machinery
Q Science > QC Physics

Schools:

School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

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Item Type:

Conference or Workshop Item

Presentation Type:

Paper

Depositing User:

Feng Gao

Date Deposited:

05 Jul 2010 09:45

Revision:

Last Modified:

28 Aug 2021 22:12

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