A New Approach to Surface Metrology - Structured Surfaces
Blunt, Liam, Jiang, Xiang and Scott, Paul J.
(2007)
A New Approach to Surface Metrology - Structured Surfaces.
In:
Proceedings of the 7th International Conference of the European Society for Precision Engineering and Nanotechnology (euspen) - Bremen, Germany, 2007.
euspen, Bremen, pp. 254-257.
ISBN 978-0-9553082-2-2