Why is numerical analysis important to metrology?

Crampton, Andrew (2001) Why is numerical analysis important to metrology? In: National Measurement and British Electro Magnetic Conference, November 2001, Harrogate.

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URI:

https://eprints.hud.ac.uk/id/eprint/2489

Title:

Why is numerical analysis important to metrology?

Creators:

Crampton, Andrew

Date:

2001

Subjects:

T Technology > TK Electrical engineering. Electronics Nuclear engineering

Schools:

School of Computing and Engineering
School of Computing and Engineering > Automotive Engineering Research Group
School of Computing and Engineering > Diagnostic Engineering Research Centre
School of Computing and Engineering > Diagnostic Engineering Research Centre > Energy, Emissions and the Environment Research Group
School of Computing and Engineering > Diagnostic Engineering Research Centre > Machinery Condition and Performance Monitoring Research Group
School of Computing and Engineering > Diagnostic Engineering Research Centre > Measurement System and Signal Processing Research Group

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Item Type:

Conference or Workshop Item

Presentation Type:

Paper

Depositing User:

Date Deposited:

29 Oct 2008 16:03

Revision:

11

Last Modified:

28 Aug 2021 10:42

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