Ramasse, Q.M., Kepapstoglou, D.M., Hage, F.S., Susi, T., Kotakoski, J., Mangler, C., Ayala, P., Meyer, J., Hinks, J. A., Donnelly, S. E., Zan, R., Pan, C.T., Haigh, S.J. and Bangert, U. (2014) Atom-by-Atom STEM Investigation of Defect Engineering in Graphene. Microscopy and Microanalysis, 20 (S3). pp. 1736-1737. ISSN 1431-9276
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