Hanif, Imran, Hinks, J. A. and Donnelly, S. E. (2013) Transmission Electron Microscopy of Amorphisation and Recrystallisation of Silicon Nanowires under in situ Ion Irradiation. In: Proceedings of Computing and Engineering Annual Researchers' Conference 2013 : CEARC'13. University of Huddersfield, Huddersfield, p. 231. ISBN 9781862181212
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