The influence of Void Configuration in Statistical Parameters of Partial Discharge Signals

Macedo, Euler Tavares, Villanueva, Juan, da Costa, Edson G., Freire, Raimundo, Neto, José Maurício and Glover, Ian (2013) The influence of Void Configuration in Statistical Parameters of Partial Discharge Signals. In: International Instrumentation and Measurement Technology Conference, 6-9th May 2013, Minneapolis, USA. (Unpublished)

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https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

URI:

https://eprints.hud.ac.uk/id/eprint/17031

Title:

The influence of Void Configuration in Statistical Parameters of Partial Discharge Signals

Creators:

Macedo, Euler Tavares, Villanueva, Juan, da Costa, Edson G., Freire, Raimundo, Neto, José Maurício and Glover, Ian

Date:

May 2013

Subjects:

T Technology > T Technology (General)

Schools:

School of Computing and Engineering

Library

Item Type:

Conference or Workshop Item

Presentation Type:

Paper

Depositing User:

Sharon Beastall

Date Deposited:

26 Mar 2013 12:38

Revision:

12

Last Modified:

28 Aug 2021 11:27

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