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Automatic processing of interferogram from surface roughness measuring interferometer

Chen, Xiaomei and Long, Zuhong (1993) Automatic processing of interferogram from surface roughness measuring interferometer. Acta Optica Sinica, 13 (11). pp. 1040-1044. ISSN 0253-2239
Abstract

Computer-based processing of interferogram of surface roughness measuring intererometer is introduced in the paper, in which threshold segmenting of brightness are used for binary image processing and border following for edge curve sampling.

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Depositing User:
Xiaomei Chen
Date Deposited:
05 Feb 2013 15:19
Revision:
22
Last Modified:
28 Aug 2021 20:14
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