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Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors

Fraser, George W., Lees, John E, Pearson, James F, Nichols, Anthony P and Bailey, Paul (1994) Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors. Proceedings of SPIE, 2280. pp. 101-108. ISSN 0277-786X
Abstract

We describe our recent synchrotron measurements of microchannel plate (MCP) quantum detection efficiency made in pulse-counting mode in a 40-300 eV band containing the L shell absorption edges of silicon. The significance of this data for the calibration of the HRC-S transmission grating detector for the AXAF-I X-ray observatory is discussed.

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Item Type:
Article
Presentation Type:
Paper
Depositing User:
Sharon Beastall
Date Deposited:
05 Sep 2012 12:53
Revision:
14
Last Modified:
28 Aug 2021 11:20
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