Advances in micro and nano-scale surface metrology

Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2003) Advances in micro and nano-scale surface metrology. In: ISMTII 2003, The Sixth International Symposium on Measurement Technology and Intelligent Instruments, 28 November - 1 December 2003, Academic Building, Hong Kong University of Science and Technology, Kowloon, Hong Kong.

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URI:

https://eprints.hud.ac.uk/id/eprint/1457

Title:

Advances in micro and nano-scale surface metrology

Creators:

Blunt, Liam, Jiang, Xiang and Scott, Paul J.

Date:

2003

Subjects:

T Technology > T Technology (General)
T Technology > TA Engineering (General). Civil engineering (General)

Schools:

School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

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Item Type:

Conference or Workshop Item

Presentation Type:

Paper

Depositing User:

Date Deposited:

12 Aug 2008 15:06

Revision:

20

Last Modified:

28 Aug 2021 10:40

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