Brennan, James K., Crampton, Andrew, Jiang, Xiang, Leach, Richard K. and Harris, Peter M. (2005) Approximation of surface roughness profiles and parameters. In: International Conference on Advanced Mathematical and Computational Tools in Metrology (AMCTM 2005), 27–29 June, 2005, Instituto Português da Qualidade, Caparica, Portugal. (Unpublished)
Information
Library
Statistics
Add to AnyAdd to TwitterAdd to FacebookAdd to LinkedinAdd to PinterestAdd to Email