Approximation of surface roughness profiles and parameters

Brennan, James K., Crampton, Andrew, Jiang, Xiang, Leach, Richard K. and Harris, Peter M. (2005) Approximation of surface roughness profiles and parameters. In: International Conference on Advanced Mathematical and Computational Tools in Metrology (AMCTM 2005), 27–29 June, 2005, Instituto Português da Qualidade, Caparica, Portugal. (Unpublished)

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URI:

https://eprints.hud.ac.uk/id/eprint/1147

Title:

Approximation of surface roughness profiles and parameters

Creators:

Brennan, James K., Crampton, Andrew, Jiang, Xiang, Leach, Richard K. and Harris, Peter M.

Date:

June 2005

Subjects:

T Technology > T Technology (General)
T Technology > TA Engineering (General). Civil engineering (General)

Schools:

School of Computing and Engineering
School of Computing and Engineering > Automotive Engineering Research Group
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
School of Computing and Engineering > High-Performance Intelligent Computing
School of Computing and Engineering > High-Performance Intelligent Computing > Planning, Autonomy and Representation of Knowledge
School of Computing and Engineering > High-Performance Intelligent Computing > Planning, Autonomy and Representation of Knowledge
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School of Computing and Engineering > High-Performance Intelligent Computing > Information and Systems Engineering Group

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Item Type:

Conference or Workshop Item

Presentation Type:

Poster

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Date Deposited:

21 Jul 2008 13:49

Revision:

20

Last Modified:

28 Aug 2021 10:39

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