Advances in micro and nano-scale surface metrology

Blunt, Liam; Jiang, Xiang; Scott, Paul J.

Advances in micro and nano-scale surface metrology

Blunt, Liam, Jiang, Xiang and Scott, Paul J. (2005) Advances in micro and nano-scale surface metrology. Key Engineering Materials, 295-29. pp. 431-436. ISSN 1013-9826

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URI:

https://eprints.hud.ac.uk/id/eprint/1137

Title:

Advances in micro and nano-scale surface metrology

Creators:

Blunt, Liam, Jiang, Xiang and Scott, Paul J.

Official URL:

http://www.scientific.net/0-87849-977-6/431/

Date:

October 2005

Subjects:

T Technology > T Technology (General)
T Technology > TA Engineering (General). Civil engineering (General)

Schools:

School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

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Item Type:

Article

Depositing User:

Briony Heyhoe

Date Deposited:

21 Jul 2008 11:00

Revision:

15

Last Modified:

28 Aug 2021 10:39

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