Brennan, James K., Crampton, Andrew, Jiang, Xiang, Leach, Richard K. and Harris, Peter M.
Approximation of surface roughness profiles and parameters.
In: International Conference on Advanced Mathematical and Computational Tools in Metrology (AMCTM 2005), 27–29 June, 2005, Instituto Português da Qualidade, Caparica, Portugal.
Brennan, James K., Mason, John C., Jiang, Xiang, Leach, Richard K. and Harris, Peter M.
Approximation of surface texture profiles and parameters.
In: 4th International Conference of the European Society for Precision Engineering and Nanotechnology, euspen, 30th May - 3rd June 2004, Scottish Exhibition and Conference Centre (SECC), Glasgow.
This list was generated on Wed Jul 27 10:52:47 2016 UTC.