Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2010) Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford. (Unpublished)

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Item Type:	Conference or Workshop Item (Speech)
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering T Technology > TS Manufactures
Schools:	School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Related URLs:	Conference Author Author Author
Depositing User:	Feng Gao
Date Deposited:	19 Nov 2010 15:34
Last Modified:	30 Mar 2018 09:01
URI:	http://eprints.hud.ac.uk/id/eprint/9072

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