Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn (2010) Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target. In: 3rd European Target Fabrication Workshop, 30 September-1 October, Oxford. (Unpublished)

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URI:

https://eprints.hud.ac.uk/id/eprint/9072

Title:

Wavelength Scanning Interferometry for Thin Film Analysis of Fusion Target

Creators:

Gao, F., Jiang, Xiang, Muhamedsalih, Hussam and Martin, Haydn

Official URL:

http://www.clf.rl.ac.uk/18838.aspx

Date:

1 October 2010

Subjects:

T Technology > TK Electrical engineering. Electronics Nuclear engineering
T Technology > TS Manufactures

Schools:

School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group

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Item Type:

Conference or Workshop Item

Presentation Type:

Speech

Depositing User:

Feng Gao

Date Deposited:

19 Nov 2010 15:34

Revision:

Last Modified:

28 Aug 2021 21:55

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