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Gao, F., Harms, C., Zhao, X. and Koenders, L. (1997) Calibration of Standard Using a Scanning Probe Microscope. In: European Workshop on Micro-technology and Scanning Probe Microscope, 1997, Mainz, Germany.
Metadata only available from this repository.| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | Q Science > QC Physics |
| Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
| Related URLs: | |
| Depositing User: | Feng Gao |
| Date Deposited: | 06 Jul 2010 13:19 |
| Last Modified: | 02 Dec 2010 13:38 |
| URI: | http://eprints.hud.ac.uk/id/eprint/7992 |
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