Gao, F., Harms, C., Zhao, X. and Koenders, L. (1997) Calibration of Standard Using a Scanning Probe Microscope. In: European Workshop on Micro-technology and Scanning Probe Microscope, 1997, Mainz, Germany.
Metadata only available from this repository.Item Type: | Conference or Workshop Item (Paper) |
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Subjects: | Q Science > QC Physics |
Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
Related URLs: | |
Depositing User: | Feng Gao |
Date Deposited: | 06 Jul 2010 13:19 |
Last Modified: | 28 Aug 2021 10:57 |
URI: | http://eprints.hud.ac.uk/id/eprint/7992 |
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