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Liu, X. and Gao, F. (2001) Multi-function evaluation of surfaces at micro/nano scales by a new tribological probe microscope. In: 2nd euspen International Conference, 27-31, May 2001, Turin, Italy.
Metadata only available from this repository.| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | T Technology > TJ Mechanical engineering and machinery Q Science > QC Physics |
| Schools: | School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group |
| Depositing User: | Feng Gao |
| Date Deposited: | 06 Jul 2010 13:00 |
| Last Modified: | 06 Apr 2018 20:15 |
| URI: | http://eprints.hud.ac.uk/id/eprint/7980 |
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