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Development of on-machine measurement for ultra-precision machining

Li, Duo, Jiang, Xiangqian, Blunt, Liam, Tong, Zhen, Williamson, James and Young, Christian (2017) Development of on-machine measurement for ultra-precision machining. In: euspen's 17th International Conference, 29 May - 2 June 2017, Hannover, Germany. (Unpublished)

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Abstract

Surface measurement is playing an increasingly important role in ultra-precision manufacturing. Nowadays, there is a technological shift from offline measurement to on-machine measurement, forming a closed-loop control for manufacturing processes. Conventionally, the transportation operations between the measurement and machine coordinates are time-consuming and inevitably induce more errors, which cannot be neglected, especially at the ultra-precision level. Development of on-machine measurement for ultra-precision machining processes will enable the reduction of measurement cycle time as well as potential improvement of machining accuracy. In the present study, an in-house designed interferometer probe, called Dispersed Reference Interferometer (DRI) is integrated on an ultra-precision diamond turning machine (Precitech Nanoform 250). The alignment method of DRI is firstly described, in order to establish the measurement coordinate. Different on-machine measurement strategies are also discussed, including multiple radial, multiple circular, and spiral trajectories. Experimental study has shown that the on-machine measurement results of a cosine form sample agree well with the offline measurement. The measurement error difference is less than 10% and correlation coefficient is 0.991.

Item Type: Conference or Workshop Item (Poster)
Uncontrolled Keywords: ultra-precision diamond machining, on-machine measurement, non-contact, interferometry
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies > EPSRC Centre for Innovative Manufacturing in Advanced Metrology
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Depositing User: Liam Blunt
Date Deposited: 19 Jul 2017 09:36
Last Modified: 14 Dec 2017 14:44
URI: http://eprints.hud.ac.uk/id/eprint/32458

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