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Quadrature wavelength scanning interferometry

Moschetti, Giuseppe, Forbes, Alistair B., Leach, Richard, Jiang, Xiang and Connor, Daniel (2016) Quadrature wavelength scanning interferometry. Applied Optics, 55 (20). pp. 5332-5340. ISSN 1559-128X

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Abstract

A novel method to double the measurement range of wavelength scanning interferometery (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, that is, from an interference
signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described, and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to nonideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances.

Item Type: Article
Subjects: T Technology > T Technology (General)
T Technology > TJ Mechanical engineering and machinery
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
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Depositing User: Prashant Kumar
Date Deposited: 25 May 2017 13:19
Last Modified: 08 Jun 2017 16:26
URI: http://eprints.hud.ac.uk/id/eprint/32031

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