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A novel profilometer for nanometric form assessment for large machined surfaces

Yang, H., Kim, S. and Walker, D.D. (2004) A novel profilometer for nanometric form assessment for large machined surfaces. Key Engineering Materials, Advances in Abrasive Technology VI, 257. pp. 225-230. ISSN 1013-9826

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Item Type: Article
Uncontrolled Keywords: Science & Technology, Technology, Materials Science, Ceramics, Materials Science, Composites, Materials Science, stylus profilometry, laser interferometry, surface form, large machined surface, LONG-TRACE-PROFILER
Subjects: T Technology > TS Manufactures
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
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Depositing User: Catherine Parker
Date Deposited: 01 Dec 2016 13:10
Last Modified: 01 Dec 2016 13:10
URI: http://eprints.hud.ac.uk/id/eprint/30428

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