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Two-dimensional surface-profile imaging technique based on double-grating frequency shifter

Wang, Kaiwei and Zeng, L. (2005) Two-dimensional surface-profile imaging technique based on double-grating frequency shifter. Applied Optics, 44 (22). pp. 4625-4630. ISSN 0003-6935

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Abstract

A two-dimensional surface profile imaging technique that uses a low-coherence heterodyne interferometer is proposed. A double-grating frequency shifter was used in a tandem interferometer to provide the achromatic frequency shift for low-coherence light. A chopper, together with a processing circuit, was implemented to modulate the interference fringes. The surface profile was measured from the interference fringes taken by a CCD camera using a five-step method. The uncertainty in the displacement measurement is 0.34 µm for a displacement range of 43 µm. The surface profile of a glass sample with low effective reflectivity was acquired

Item Type: Article
Additional Information: UoA 25 (General Engineering) Published in Applied Optics © 2005 Optical Society of America
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Q Science > QC Physics
Schools: School of Computing and Engineering
School of Computing and Engineering > Centre for Precision Technologies
School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
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Depositing User: Briony Heyhoe
Date Deposited: 18 Jul 2007
Last Modified: 29 Mar 2018 14:45
URI: http://eprints.hud.ac.uk/id/eprint/291

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