Why is numerical analysis important to metrology?

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Crampton, Andrew (2001) Why is numerical analysis important to metrology? In: National Measurement and British Electro Magnetic Conference, November 2001, Harrogate.

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Item Type:	Conference or Workshop Item (Paper)
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Schools:	School of Computing and Engineering School of Computing and Engineering > Automotive Engineering Research Group School of Computing and Engineering > Diagnostic Engineering Research Centre School of Computing and Engineering > Diagnostic Engineering Research Centre > Energy, Emissions and the Environment Research Group School of Computing and Engineering > Diagnostic Engineering Research Centre > Machinery Condition and Performance Monitoring Research Group School of Computing and Engineering > Diagnostic Engineering Research Centre > Measurement System and Signal Processing Research Group
Related URLs:	Conference Author
Depositing User:	Cherry Edmunds
Date Deposited:	29 Oct 2008 16:03
Last Modified:	28 Aug 2021 10:42
URI:	http://eprints.hud.ac.uk/id/eprint/2489

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