Application of the lifting wavelet to rough surfaces

Jiang, Xiang, Blunt, Liam and Stout, K.J. (2001) Application of the lifting wavelet to rough surfaces. Precision Engineering, 25 (2). pp. 83-89. ISSN 0141-6359

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Abstract

This paper proposes a lifting wavelet model for enhancement of accuracy of surface roughness characterisation. In this work, the theory and fast algorithm of the lifting wavelet are briefly introduced and a lifting wavelet model for extraction of roughness of surfaces has been developed. The rough surface recovered has good refinement accuracy in contrast to the least squares polynomial fitting. Applications are conducted by using a series of typical surfaces, planes and curves, measured by contact (stylus) and non-contact (phase-shifting interferometry) instruments, to demonstrate the feasibility and applicability of using the lifting wavelet model in the analysis of these surfaces

Item Type:	Article
Subjects:	T Technology > T Technology (General) T Technology > TA Engineering (General). Civil engineering (General)
Schools:	School of Computing and Engineering School of Computing and Engineering > Centre for Precision Technologies School of Computing and Engineering > Centre for Precision Technologies > Surface Metrology Group
Related URLs:	Author Author
Depositing User:	Briony Heyhoe
Date Deposited:	30 Sep 2008 10:26
Last Modified:	06 Apr 2018 20:30
URI:	http://eprints.hud.ac.uk/id/eprint/2043

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