Retention of data in heat-damaged SIM cards and potential recovery methods

Jones, Benjamin and Kenyon, A.J. (2008) Retention of data in heat-damaged SIM cards and potential recovery methods. Forensic Science International, 177. pp. 42-46. ISSN 03790738

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Abstract

Examination of various SIM cards and smart card devices indicates that data may be retained in SIM card memory structures even after heating to temperatures up to 450oC, which the National Institute of Standards and Technology (NIST) has determined to be approximately the maximum average sustained temperature at desk height in a house fire. However, in many cases, and certainly for temperatures greater than 450oC, the SIM card chip has suffered structural or mechanical damage that renders simple probing or rewiring ineffective. Nevertheless, this has not necessarily affected the data, which is stored as charge in floating gates, and alternative methods for directly accessing the stored charge may be applicable.

Item Type:	Article
Uncontrolled Keywords:	Forensic science Mobile phones Cell phones Data recovery Scanning Probe Microscopy
Subjects:	K Law > K Law (General) Q Science > QC Physics T Technology > TK Electrical engineering. Electronics Nuclear engineering
Schools:	School of Applied Sciences
Related URLs:	http://dx.doi.org/10.1016/j.forsciint.20... http://bura.brunel.ac.uk/handle/2438/138... Author
Depositing User:	Ben Jones
Date Deposited:	17 Dec 2013 16:36
Last Modified:	02 Dec 2016 03:46
URI:	http://eprints.hud.ac.uk/id/eprint/19294

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